54ACQ245LMQB. National Semiconductor, 54ACQ245LMQB. Datasheet - Page 8

• Manufacturer Part Number: 54ACQ245LMQB.
• Manufacturer: National Semiconductor

Specifications of 54ACQ245LMQB.

• Lead Free Status / Rohs Status: Not Compliant

DSCC FORM 2234
APR 97
1/
2/
3/
4/
5/
6/
7/
8/
9/
10/ This parameter shall be guaranteed, if not tested, to the limits in table I, herein.
For negative and positive voltage and current values, the sign designates the potential difference in reference to GND and
Three-state output conditions are required.
Tests shall be performed in sequence, attributes data only. Functional tests shall include the truth table and other logic
patterns used for fault detection. The test vectors used to verify the truth table shall, at a minimum, test all functions of each
input and output. All possible input to output logic patterns per function shall be guaranteed, if not tested, to the truth table
in figure 2 herein. For V
AC limits at V
V
V
This test is for qualification only. Ground and V
For tests not listed in the referenced MIL-STD-883 (e.g. I
herein. All inputs and outputs shall be tested, as applicable, to the tests in table I herein.
Each input/output, as applicable, shall be tested at the specified temperature, for the specified limits to the tests in table I
herein. Output terminals not designated shall be high level logic, low level logic, or open, except for all I
terminals shall be open. When performing the I
flows through the meter. The values to be used for V
section 1.4 herein.
the direction of current flow, respectively; and the absolute value of the magnitude, not the sign, is relative to the minimum
and maximum limits, as applicable, listed herein. All devices shall meet or exceed the limits specified in table I, as
applicable, at 3.0 V ≤ V
Transmission driving tests are performed at V
using V
Power dissipation capacitance (C
For both P
are used to measure the magnitude of induced noise caused by other simultaneously switching outputs. The test is
performed on a low noise bench test fixture. For the device under test, all outputs shall be loaded with 500Ω of load
resistance and a minimum of 50 pF of load capacitance (see figure 4). Only chip capacitors and resistors shall be used.
The output load components shall be located as close as possible to the device outputs. It is suggested that, whenever
possible, this distance be kept to less than 0.25 inches. Decoupling capacitors shall be placed in parallel from V
ground. The device manufacturer shall determine the values of these decoupling capacitors. The low and high level ground
and V
impedance.
The device inputs shall be conditioned such that all outputs are at a high nominal V
conditioned such that they switch simultaneously and the output under test remains at V
switched from V
peaks, respectively (see figure 4). This is then repeated with the same outputs not under test switching from V
The device inputs shall be conditioned such that all outputs are at a low nominal V
conditioned such that they switch simultaneously and the output under test remains at V
switched from V
peaks, respectively (see figure 4). This is then repeated with the same outputs not under test switching from V
time limits for V
CC
CC
P
I
S
D
= 3.6 V are equal to the limits at V
= 4.5 V and V
DEFENSE SUPPLY CENTER COLUMBUS
= (C
= (C
CC
IN
bounce noise is measured at the quiet output using a 1 GHz minimum bandwidth oscilloscope with a 50Ω input
MICROCIRCUIT DRAWING
PD
= V
PD
COLUMBUS, OHIO 43218-3990
D
+ C
and I
+ C
CC
CC
L
CC
or GND. When V
L
)V
OH
OL
= 5.5 V are equal to the limits at V
) (V
S
CC
CC
, f is the frequency of the input signal and C
= 5.5 V and V
STANDARD
to V
to V
f + I
CC
= 3.0 V, respectively, in table I herein. For propagation delay tests, all paths must be tested.
OH
OL
CC
x V
OUT
CC
. V
. V
≤ 3.6 V and 4.5 V ≤ V
CC
measurements, H ≥ 0.7V
OHV
OLP
)f + (I
TABLE I. Electrical performance characteristics – Continued.
and V
CC
and V
PD
IN
CC
= 3.6 V shall be guaranteed to be no more than 0.5 ns less than those specified at
) determines the power consumption (P
= V
x V
OLV
OHP
CC
CC
CC
= 3.0 V and guaranteed by testing at V
are then measured from the nominal V
or GND is used, the test is guaranteed for V
are then measured from the nominal V
)
CC
CC
CC
CC
= 5.5 V dc with a 2 ms duration maximum. This test may be performed
bounce tests are performed on a non-switching (quiescent) output and
CC
tests, the current meter shall be placed in the circuit such that all current
≤ 5.5 V.
CC
IH
= 4.5 V and guaranteed by testing at V
and V
and L < 0.3V
CCZ
), utilize the general test procedure under the conditions listed
IL
L
shall be the V
is the external output load capacitance.
SIZE
A
CC
.
D
) and the current consumption (I
IH
REVISION LEVEL
minimum and V
CC
OL
OH
OL
= 3.0 V. Minimum propagation delay
OH
level to the largest positive and negative
level to the largest negative and positive
level. The device inputs shall then be
level. The device inputs shall then be
IN
OH
OL
= 3.85 V or 1.65 V.
B
as all other outputs possible are
as all other outputs possible are
CC
= 4.5 V. AC limits at
IL
maximum values listed in
CC
SHEET
tests, the output
5962-92177
S
).
OL
OH
CC
to V
to V
8
to
OH
OL
.
.