EPF10K20RC208-3N Altera, EPF10K20RC208-3N Datasheet - Page 44
![IC FLEX 10K FPGA 20K 208-RQFP](/photos/6/70/67069/544-208-rqfp_sml.jpg)
EPF10K20RC208-3N
Manufacturer Part Number
EPF10K20RC208-3N
Description
IC FLEX 10K FPGA 20K 208-RQFP
Manufacturer
Altera
Series
FLEX-10K®r
Datasheet
1.EPF10K10ATC100-3.pdf
(128 pages)
Specifications of EPF10K20RC208-3N
Number Of Logic Elements/cells
1152
Number Of Labs/clbs
144
Total Ram Bits
12288
Number Of I /o
147
Number Of Gates
63000
Voltage - Supply
4.75 V ~ 5.25 V
Mounting Type
Surface Mount
Operating Temperature
0°C ~ 85°C
Package / Case
208-RQFP
Family Name
FLEX 10K
Number Of Usable Gates
20000
Number Of Logic Blocks/elements
1152
# I/os (max)
147
Frequency (max)
125MHz
Process Technology
CMOS
Operating Supply Voltage (typ)
5V
Logic Cells
1152
Ram Bits
12288
Device System Gates
63000
Operating Supply Voltage (min)
4.75V
Operating Supply Voltage (max)
5.25V
Operating Temp Range
0C to 70C
Operating Temperature Classification
Commercial
Mounting
Surface Mount
Pin Count
208
Package Type
RQFP
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
544-2208
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
EPF10K20RC208-3N
Manufacturer:
ALTERA
Quantity:
5 530
Company:
Part Number:
EPF10K20RC208-3N
Manufacturer:
ALTERA
Quantity:
6 100
Generic Testing
Operating
Conditions
44
FLEX 10K Embedded Programmable Logic Device Family Data Sheet
Symbol
V
V
I
T
T
T
Table 17. FLEX 10K 5.0-V Device Absolute Maximum Ratings
OUT
STG
AMB
J
CC
I
Supply voltage
DC input voltage
DC output current, per pin
Storage temperature
Ambient temperature
Junction temperature
Parameter
Each FLEX 10K device is functionally tested. Complete testing of each
configurable SRAM bit and all logic functionality ensures 100% yield.
AC test measurements for FLEX 10K devices are made under conditions
equivalent to those shown in
to configure devices during all stages of the production flow.
Figure 19. FLEX 10K AC Test Conditions
Tables 17
recommended operating conditions, DC operating conditions, and
capacitance for 5.0-V FLEX 10K devices.
Power supply transients can affect AC
measurements. Simultaneous transitions of
multiple outputs should be avoided for
accurate measurement. Threshold tests must
not be performed under AC conditions.
Large-amplitude, fast-ground-current
transients normally occur as the device
outputs discharge the load capacitances.
When these transients flow through the
parasitic inductance between the device
ground pin and the test system ground,
significant reductions in observable noise
immunity can result. Numbers without
parentheses are for 5.0-V devices or outputs.
Numbers in parentheses are for 3.3-V devices
or outputs. Numbers in brackets are for
2.5-V devices or outputs.
through
With respect to ground
No bias
Under bias
Ceramic packages, under bias
PQFP, TQFP, RQFP, and BGA
packages, under bias
21
provide information on absolute maximum ratings,
Conditions
Figure
(2)
Note (1)
19. Multiple test patterns can be used
Device
Output
Device input
rise and fall
times < 3 ns
(8.06 k )
(703 )
[481
[521 ]
464
250
–2.0
–2.0
Min
–25
–65
–65
Altera Corporation
C1 (includes
JIG capacitance)
Max
150
135
150
135
7.0
7.0
25
To Test
System
VCC
Unit
mA
° C
° C
° C
° C
V
V