EP2S15F672I4N Altera, EP2S15F672I4N Datasheet - Page 214
EP2S15F672I4N
Manufacturer Part Number
EP2S15F672I4N
Description
IC STRATIX II FPGA 15K 672-FBGA
Manufacturer
Altera
Series
Stratix® IIr
Datasheet
1.EP2S15F484I4N.pdf
(238 pages)
Specifications of EP2S15F672I4N
Number Of Logic Elements/cells
15600
Number Of Labs/clbs
780
Total Ram Bits
419328
Number Of I /o
366
Voltage - Supply
1.15 V ~ 1.25 V
Mounting Type
Surface Mount
Operating Temperature
-40°C ~ 100°C
Package / Case
672-FBGA
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Number Of Gates
-
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Manufacturer:
ALTERA
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Duty Cycle Distortion
Figure 5–8. DCD Measurement Technique for Non-DDIO (Single-Data Rate) Outputs
5–78
Stratix II Device Handbook, Volume 1
clk
INPUT
VCC
Figure 5–7. Duty Cycle Distortion
DCD expressed in absolution derivation, for example, D1 or D2 in
Figure
percentage, and the percentage number is clock-period dependent. DCD
as a percentage is defined as
DCD Measurement Techniques
DCD is measured at an FPGA output pin driven by registers inside the
corresponding I/O element (IOE) block. When the output is a single data
rate signal (non-DDIO), only one edge of the register input clock (positive
or negative) triggers output transitions
present on the input clock signal or caused by the clock input buffer or
different input I/O standard does not transfer to the output signal.
IOE
(T/2 – D1) / T (the low percentage boundary)
(T/2 + D2) / T (the high percentage boundary)
5–7, is clock-period independent. DCD can also be expressed as a
NOT
inst1
CLKH = T/2
Falling Edge A
DFF
inst
Ideal Falling Edge
Clock Period (T)
D
CLRN
PRN
D1
Q
D2
(Figure
Falling Edge B
CLKL = T/2
5–8). Therefore, any DCD
OUTPUT
Altera Corporation
output
April 2011
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