EP4CGX150CF23I7N Altera, EP4CGX150CF23I7N Datasheet - Page 40

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EP4CGX150CF23I7N

Manufacturer Part Number
EP4CGX150CF23I7N
Description
IC CYCLONE IV FPGA 150K 484FBGA
Manufacturer
Altera
Series
CYCLONE® IV GXr

Specifications of EP4CGX150CF23I7N

Number Of Logic Elements/cells
149760
Number Of Labs/clbs
9360
Total Ram Bits
6480000
Number Of I /o
270
Voltage - Supply
1.16 V ~ 1.24 V
Mounting Type
Surface Mount
Operating Temperature
-40°C ~ 100°C
Package / Case
484-FBGA
Family Name
Cyclone IV
Number Of Logic Blocks/elements
149760
# I/os (max)
270
Operating Supply Voltage (typ)
1.2V
Logic Cells
149760
Ram Bits
6635520
Operating Supply Voltage (min)
1.16V
Operating Supply Voltage (max)
1.24V
Operating Temp Range
-40C to 100C
Operating Temperature Classification
Industrial
Mounting
Surface Mount
Pin Count
484
Package Type
FBGA
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Number Of Gates
-
Lead Free Status / Rohs Status
Compliant

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1–40
Table 1–46. Glossary (Part 3 of 5)
Cyclone IV Device Handbook, Volume 3
Letter
S
T
Single-ended
voltage-
referenced I/O
Standard
SW (Sampling
Window)
t
Channel-to-
channel-skew
(TCCS)
tcin
t
tcout
t
t
t
Timing Unit
Interval (TUI)
t
t
t
tpllcin
tpllcout
C
CO
DUTY
FALL
H
INJITTER
OUTJITTER_DEDCLK
OUTJITTER_IO
Term
The JEDEC standard for SSTl and HSTL I/O standards defines both the AC and DC input signal
values. The AC values indicate the voltage levels at which the receiver must meet its timing
specifications. The DC values indicate the voltage levels at which the final logic state of the
receiver is unambiguously defined. After the receiver input crosses the AC value, the receiver
changes to the new logic state. The new logic state is then maintained as long as the input stays
beyond the DC threshold. This approach is intended to provide predictable receiver timing in the
presence of input waveform ringing.
High-speed I/O block: The period of time during which the data must be valid to capture it
correctly. The setup and hold times determine the ideal strobe position in the sampling window.
High-speed receiver and transmitter input and output clock period.
High-speed I/O block: The timing difference between the fastest and slowest output edges,
including t
Delay from the clock pad to the I/O input register.
Delay from the clock pad to the I/O output.
Delay from the clock pad to the I/O output register.
High-speed I/O block: Duty cycle on high-speed transmitter output clock.
Signal high-to-low transition time (80–20%).
Input register hold time.
High-speed I/O block: The timing budget allowed for skew, propagation delays, and data sampling
window. (TUI = 1/(Receiver Input Clock Frequency Multiplication Factor) = t
Period jitter on the PLL clock input.
Period jitter on the dedicated clock output driven by a PLL.
Period jitter on the general purpose I/O driven by a PLL.
Delay from the PLL inclk pad to the I/O input register.
Delay from the PLL inclk pad to the I/O output register.
V
V
CO
OH
OL
variation and clock skew. The clock is included in the TCCS measurement.
Definitions
V
REF
Chapter 1: Cyclone IV Device Datasheet
© December 2010 Altera Corporation
V
V
IH(DC)
IL(DC)
C
/w).
V
V
IH ( AC )
IL(AC )
V
CCIO
V
Glossary
SS

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