AD9058ATJ/883B Analog Devices Inc, AD9058ATJ/883B Datasheet - Page 10
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AD9058ATJ/883B
Manufacturer Part Number
AD9058ATJ/883B
Description
IC ADC 8BIT DUAL 50MSPS 44-JLCC
Manufacturer
Analog Devices Inc
Datasheet
1.AD9058ATJ883B.pdf
(12 pages)
Specifications of AD9058ATJ/883B
Lead Free Status / Rohs Status
Contains lead / RoHS non-compliant
Other names
Q6367495
Available stocks
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Part Number
Manufacturer
Quantity
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DSCC FORM 2234
APR 97
approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The test
circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-
STD-883.
4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table II herein.
4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:
4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature, or
4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table II herein.
a.
b.
c.
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control
and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs,
outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-
STD-883.
T
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
DEFENSE SUPPLY CENTER COLUMBUS
A
= +125 C, minimum.
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43216-5000
1/ PDA applies to subgroup 1.
Interim electrical
Final electrical
Group A test
Group C end-point electrical
Group D end-point electrical
Group E end-point electrical
parameters (see 4.2)
parameters (see 4.2)
requirements (see 4.4)
parameters (see 4.4)
parameters (see 4.4)
parameters (see 4.4)
Test requirements
STANDARD
TABLE II. Electrical test requirements.
method 5005, table I)
1, 2, 3, 4, 7, 8, 9 1/
(in accordance with
1, 2, 3, 4, 7, 8, 9
Subgroups
class M
Device
MIL-STD-883,
---
1
1
1
SIZE
A
1, 2, 3, 4, 7, 8,
1, 2, 3, 4, 7, 8,
MIL-PRF-38535, table III)
class Q
Device
9, 1/
(in accordance with
---
1
9
1
1
REVISION LEVEL
Subgroups
1, 2, 3, 4, 7,
1, 2, 3, 4, 7,
B
8, 9, 1/
class V
Device
8, 9
---
1
1
1
SHEET
5962-94703
10