IP4264CZ8-10-TTL NXP Semiconductors, IP4264CZ8-10-TTL Datasheet - Page 7
![no-image](/images/manufacturer_photos/0/4/487/nxp_semiconductors_sml.jpg)
IP4264CZ8-10-TTL
Manufacturer Part Number
IP4264CZ8-10-TTL
Description
Manufacturer
NXP Semiconductors
Datasheet
1.IP4264CZ8-10-TTL.pdf
(15 pages)
Specifications of IP4264CZ8-10-TTL
Lead Free Status / Rohs Status
Compliant
NXP Semiconductors
IP4264CZ8-10_20_40-TTL
Product data sheet
Fig 5.
Crosstalk measurement setup
50 Ω
V gen
50 Ω
7.2 Crosstalk
IN1
IN2
TEST BOARD
The setup for measuring crosstalk between channels in a 50 system is shown in
Figure
IP4264CZ8-20-TTL in
are terminated with a 50 resistor to ground.
The crosstalk between any pin and pin 4 and pin 5 is similar to the crosstalk between the
channels.
DUT
5. The crosstalk for IP4264CZ8-10-TTL is shown in
OUT2
OUT1
All information provided in this document is subject to legal disclaimers.
50 Ω
018aaa019
Integrated (U)SIM card passive filter array with ESD protection
Figure 7
50 Ω
Rev. 1 — 8 July 2011
and for IP4264CZ8-40-TTL in
Fig 6.
IP4264CZ8-10/20/40-TTL
(dB)
S
(1) Pin 1 to 7
(2) Pin 2 to 6
(3) Pin 3 to 8
21
–30
–60
–90
0
10
C
IP4264CZ8-10-TTL: Crosstalk behavior
–1
ch
= 10 pF
1
10
Figure
Figure
10
2
6, for
(1)
(3)
8. Unused channels
© NXP B.V. 2011. All rights reserved.
10
018aaa146
3
f (MHz)
(2)
10
4
7 of 15