NOII4SM6600A-QDC ON Semiconductor, NOII4SM6600A-QDC Datasheet - Page 30

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NOII4SM6600A-QDC

Manufacturer Part Number
NOII4SM6600A-QDC
Description
Manufacturer
ON Semiconductor
Datasheet

Specifications of NOII4SM6600A-QDC

Lead Free Status / Rohs Status
Supplier Unconfirmed
Acronyms
ADC
AFE
BL
CDM
CDS
CMOS
CRC
DAC
DDR
DFT
DNL
DS
DSNU
EIA
ESD
FE
FF
FOT
FPGA
FPN
FPS
FS
HBM
IMG
INL
Acronym
analog-to-digital converter
analog front end
black pixel data
Charged Device Model
correlated double sampling
complementary metal oxide semiconductor
cyclic redundancy check
digital-to-analog converter
double data rate
design for test
differential nonlinearity
Double Sampling
dark signal non-uniformity
Electronic Industries Alliance
electrostatic discharge
frame end
fill factor
frame overhead time
Field Programmable Gate Array
fixed pattern noise
frames per second
frame start
Human Body Model
regular pixel data
integral nonlinearity
Description
Rev. 9 | www.onsemi.com | Page 30 of 32
IP
LE
LS
LSB
LVDS
MBS
MSB
PGA
PLS
PRBS
PRNU
QE
RGB
RMA
RMS
ROI
ROT
S/H
SNR
SPI
TBD
TIA
T
TR
% RH
Acronym
J
intellectual property
line end
line start
least significant bit
low-voltage differential signaling
mixed boundary scan
most significant bit
programmable gain amplifier
parasitic light sensitivity
pseudo-random binary sequence
pixel random non-uniformity
quantum efficiency
red green blue
Return Material Authorization
root mean square
region of interest
row overhead time
sample and hold
signal-to-noise ratio
serial peripheral interface
to be determined
Telecommunications Industry Association
Junction Temperature
training pattern
Percent Relative Humidity
Description
NOII4SM6600A

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