AM29F040-120JC AMD (ADVANCED MICRO DEVICES), AM29F040-120JC Datasheet - Page 21

• Manufacturer Part Number: AM29F040-120JC
• Manufacturer: AMD (ADVANCED MICRO DEVICES)

Specifications of AM29F040-120JC

• Lead Free Status / Rohs Status: Not Compliant

AC CHARACTERISTICS
Read Only Operations Characteristics
Notes:
1.
2. Output driver disable time.
3. Not 100% tested.
Parameter Symbols
Notes:
For –55: C
For all others: C
JEDEC
t
t
t
t
t
t
t
GLQV
EHQZ
GHQZ
AXQX
AVQV
ELQV
AVAV
Test Conditions (for -55):
(for all others):
L
Standard
= 30 pF including jig capacitance
t
t
t
ACC
t
t
t
t
RC
CE
OE
DF
DF
OH
L
= 100 pF including jig capacitance
Read Cycle Time (Note 3)
Address to Output Delay
Chip Enable to Output Delay
Output Enable to Output Delay
Chip Enable to Output High Z
(Notes 2, 3)
Output Enable to Output
High Z (Notes 2, 3)
Output Hold Time from
Addresses, CE or OE,
Whichever Occurs First
Device
Under
Test
Output Load: 1 TTL gate and 30 pF
Input rise and fall times: 5 ns
Input pulse levels: 0.0 V to 3.0 V
Timing measurement reference level, input and output: 1.5 V and 1.5 V
Output Load: 1 TTL gate and 100 pF
Input rise and fall times: 20 ns
Input pulse levels: 0.45 V to 2.4 V
Timing measurement reference level, input and output: 0.8 V and 2.0 V
Description
C L
Figure 8.
OE = V
CE = V
OE = V
Am29F040
Test Setup
or Equivalent
6.2 k
Test Conditions
IN3064
IL
IL
IL
Max
Max
Max
Max
Min
Min
5.0 V
-55
55
55
18
18
55
30
0
2.7 k
Speed Options (Note 1)
Diodes = IN3064
or Equivalent
-70
70
70
70
30
20
20
0
-90
90
90
20
20
90
35
0
-120
120
120
120
30
30
50
0
-150
150
150
150
35
35
55
0
17113E-13
Unit
ns
ns
ns
ns
ns
ns
ns
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