5962-8764801XA QP SEMICONDUCTOR, 5962-8764801XA Datasheet - Page 14

• Manufacturer Part Number: 5962-8764801XA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-8764801XA

• Lead Free Status / Rohs Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
has a wavelength of 2537 Angstroms (Å). The integrated dose (i.e., UV intensity x exposure time) for exposure should be a
minimum of 15 Ws/cm
µW/cm
dose the device can be exposed to without damage is 7258 Ws/cm
intensity UV light for long periods may cause permanent damage.
4.6 Programming procedures. The programming procedures shall be as specified by the device manufacturer.
with reference to the previous interim electrical parameters (see line 1).
4.5 Erasing procedure. The recommended erasure procedure for the device is exposure to shortwave ultraviolet light which
2
Line
no.
10
power rating. The device should be placed within 1 inch of the lamp tubes during erasure. The maximum integrated
DEFENSE SUPPLY CENTER COLUMBUS
1
2
3
4
5
6
7
8
9
1/ (*) indicates PDA applies to subgroups 1 and 7.
2/ (**) indicates that subgroups 10 and 11, if not tested, shall be guaranteed to the specified limits in table I.
3/ (***) see 4.4.1c.
4/ Any subgroups at the same temperature may be combined when using a multifunction tester.
5/ Subgroups 7 and 8 shall consist of verifying the applicable data pattern, see 4.4.1d.
6/ ∆ indicates delta limit (see table IIB) shall be required where specified, and the delta values shall be computed
MICROCIRCUIT DRAWING
Interim electrical
Static burn-in
Same as line 1
Dynamic burn-in
Same as line 1
Final electrical
Group A test
requirements (see 4.4)
Group C end-point electrical
Group D end-point electrical
Group E end-point electrical
COLUMBUS, OHIO 43218-3990
(method 1015)
parameters (see 4.2)
(method 1015)
parameters (see 4.2)
parameters (see 4.4)
parameters (see 4.4)
parameters (see 4.4)
Test requirements
2
STANDARD
. The erasure time with this dosage is approximately 25 minutes using an ultraviolet lamp with a 12000
1/ The above parameter shall be recorded before and after
TABLE IIA. Electrical test requirements. 1/ 2/ 3/ 4/
the required burn-in and life tests to determine the delta.
Parameter 1/
STD-883, TM 5005 Table
TABLE IIB. Delta limits at +25°C.
accordance with MIL-
I
I
CC3
1, 2, 3, 4***, 7, 8A,
I
LO
LI
8B, 9, 10**, 11**
Subgroups (in
1*, 2, 3, 7*,
8A, 8B, 9
Required
2, 8A, 10
2, 8A, 10
required
class M
Device
1, 7, 9
Not
I)
2
(1 week at 12000 µW/cm
SIZE
A
Device types
(in accordance with MIL-PRF-38535, table III)
+ 10%
+ 10%
1, 2, 3, 4***, 7, 8A,
8B, 9, 10**, 11**
All
1*, 2, 3, 7*,
8A, 8B, 9
Required
2, 8A, 10
2, 8A, 10
required
class Q
Device
1, 7, 9
REVISION LEVEL
Not
Subgroups
2
). Exposure of EPROMs to high
E
1, 2, 3, 4***, 7, 8A,
8B, 9, 10**, 11**
1*, 2, 3, 7*, 8A,
8B, 9, 10, 11 ∆
1, 2, 3, 7, 8A,
8B, 9, 10, 11
2, 3, 8A, 8B
Required
Required
1*, 7* ∆
1*, 7* ∆
class V
Device
1, 7, 9
1, 7, 9
SHEET
5962-87648
14