SST25VF512-20-4C-SA Microchip Technology, SST25VF512-20-4C-SA Datasheet - Page 19

Flash 64K X 8 14 us

SST25VF512-20-4C-SA

Manufacturer Part Number
SST25VF512-20-4C-SA
Description
Flash 64K X 8 14 us
Manufacturer
Microchip Technology
Datasheet

Specifications of SST25VF512-20-4C-SA

Memory Type
NAND
Memory Size
512 Kbit
Architecture
Sectored
Interface Type
SPI
Access Time
20 ns
Supply Voltage (max)
3.6 V
Supply Voltage (min)
2.7 V
Maximum Operating Current
10 mA
Operating Temperature
+ 70 C
Mounting Style
SMD/SMT
Package / Case
SOIC-8
Organization
64 KB x 8
Lead Free Status / Rohs Status
No RoHS Version Available

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
SST25VF512-20-4C-SA
Manufacturer:
LSI
Quantity:
19
Part Number:
SST25VF512-20-4C-SA
Manufacturer:
ST
0
Part Number:
SST25VF512-20-4C-SA
Manufacturer:
SST
Quantity:
20 000
Part Number:
SST25VF512-20-4C-SAE
Manufacturer:
SST
Quantity:
20 000
Part Number:
SST25VF512-20-4C-SAE-T
Manufacturer:
SST
Quantity:
10 122
512 Kbit SPI Serial Flash
SST25VF512
©2005 Silicon Storage Technology, Inc.
AC test inputs are driven at V
for inputs and outputs are V
FIGURE 19: AC I
FIGURE 20: A T
V IHT
V ILT
EST
NPUT
INPUT
L
OAD
/O
HT
UTPUT
IHT
(0.7V
E
XAMPLE
(0.9V
R
1192 F03.0
DD
TO DUT
EFERENCE
DD
) and V
) for a logic “1” and V
V HT
V LT
LT
(0.3V
W
AVEFORMS
REFERENCE POINTS
DD
). Input rise and fall times (10%
19
TO TESTER
ILT
(0.1V
DD
) for a logic “0”. Measurement reference points
V HT
V LT
C
L
OUTPUT
90%) are <5 ns.
Note: V
1192 F02.1
V
V
V
LT
IHT
ILT
HT
- V
- V
- V
- V
S71192-08-000
LOW
HIGH
INPUT
INPUT
Test
Test
LOW Test
Data Sheet
HIGH Test
11/05

Related parts for SST25VF512-20-4C-SA