5962-8753901LA E2V, 5962-8753901LA Datasheet - Page 15

no-image

5962-8753901LA

Manufacturer Part Number
5962-8753901LA
Description
Manufacturer
E2V
Datasheet

Specifications of 5962-8753901LA

Lead Free Status / Rohs Status
Supplier Unconfirmed

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
5962-8753901LA
Manufacturer:
ATMEL
Quantity:
980
Part Number:
5962-8753901LAC
Manufacturer:
ATMEL
Quantity:
980
DSCC FORM 2234
APR 97
has a wavelength of 2537 angstroms (Å). The integrated dose (i.e., UV intensity x exposure time) for erasure should be a
minimum of 25 Ws/cm
uW/cm
dose the device can be exposed to without damage is 7258 Ws/cm
intensity UV light for long periods may cause permanent damage.
made available upon request.
(original equipment), design applications, and logistics purposes.
prepared specification or drawing.
the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.
application requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be
used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronics devices (FSC
5962) should contact DSCC-VA, telephone (614) 692-0544.
(614) 692-0547.
HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by
DSCC-VA.
4.4 Erasing procedure. The recommended erasure procedure for the device is exposure to shortwave ultraviolet light which
4.5 Programming procedure. The programming procedure shall be as specified by the device manufacturer and shall be
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-
6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for
6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus (DSCC) when a system
6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio 43218-3990, or telephone
6.6 Approved sources of supply. Approved sources of supply are listed in MIL-HDBK-103. The vendors listed in MIL-
c.
2
(2)
(3)
power rating. The device should be placed within 1 inch of the lamp tubes during erasure. The maximum integrated
DEFENSE SUPPLY CENTER COLUMBUS
All devices submitted for testing shall be programmed in accordance with 3.2.3.1 or 3.2.3.2 herein. After completion
of all testing, the devices shall be erased and verified.
MICROCIRCUIT DRAWING
T
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
COLUMBUS, OHIO 43218-3990
A
= +125C, minimum.
2
STANDARD
. The erasure time with this dosage is approximately 35 minutes using a ultraviolet lamp with a 12,000
2
(1 week at 12,000 W/cm
SIZE
A
REVISION LEVEL
2
L
). Exposure of the device to high
SHEET
5962-87539
15

Related parts for 5962-8753901LA