TD62004P TOSHIBA Semiconductor CORPORATION, TD62004P Datasheet
TD62004P
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TD62004P Summary of contents
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... INPUT BASE TYPE RESISTOR TD62001P / External 10.5−kΩ TD62002P / Zenner diode TD62003P / 2.7 kΩ TD62004P / 10.5 kΩ PIN CONNECTION (TOP VIEW) TD62001~004P/AP/F/AF DESIGNATION General Purpose Weight DIP16−P−300−2.54A : 1.11 g (Typ.) 14~25 V PMOS SOP16−P−225−1.27 : 0.16 g (Typ.) ...
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... SCHEMATICS (EACH DRIVER) TD62001P / TD62004P / Note: The input and output parasitic diodes cannot be used as clamp diodes. MAXIMUM RATINGS (Ta = 25°C) CHARACTERISTIC P, F Output Sustaining Voltage AP, AF Output Current Input Voltage Input Current P, F Clamp Diode Reverse Voltage AP, AF Clamp Diode Forward Current ...
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RECOMMENDED OPERATING CONDITIONS (Ta = −40~85°C and Ta = −30~75°C for only Type−P) CHARACTERISTIC P, F Output Sustaining Voltage AP Output Current Except Input Voltage TD62001P / TD62002 Input Voltage ...
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ELECTRICAL CHARACTERISTICS CHARACTERISTIC AP, AF Output Leakage F Current P Collector−Emitter Saturation Voltage DC Current Transfer Ratio TD62002 Input Current TD62003 (Output On) TD62004 P Input Current (Output Off) AP TD62002 Input Voltage TD62003 (Output On) TD62004 AP, ...
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TEST CIRCUIT 1. I CEX (OFF (sat (ON) 5 TD62001~004P/AP/F/AF 3. IIN (ON 2001-06-27 ...
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... Output impedance 50 Ω, t Note 2: See below INPUT CONDITION TYPE NUMBER TD62001P / TD62002P / TD62003P / TD62004P / Note 3: C includes probe and jig capacitance. L PRECAUTIONS for USING This IC does not include built-in protection circuits for excess current or overvoltage. If this IC is subjected to excess current or overvoltage, it may be destroyed. ...
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TD62001~004P/AP/F/AF 7 2001-06-27 ...
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TD62001~004P/AP/F/AF 8 2001-06-27 ...
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TD62001~004P/AP/F/AF 9 2001-06-27 ...
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TD62001~004P/AP/F/AF 10 2001-06-27 ...
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PACKAGE DIMENSIONS DIP16−P−300−2.54A Weight: 1.11 g (Typ.) TD62001~004P/AP/F/AF 11 Unit : mm 2001-06-27 ...
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PACKAGE DIMENSIONS SOP16−P−225−1.27 Weight: 0.16 g (Typ.) TD62001~004P/AP/F/AF 12 Unit : mm 2001-06-27 ...
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RESTRICTIONS ON PRODUCT USE · TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress ...