AT32UC3B0128AU Atmel Corporation, AT32UC3B0128AU Datasheet - Page 582

• Manufacturer Part Number: AT32UC3B0128AU
• Manufacturer: Atmel Corporation

Specifications of AT32UC3B0128AU

• Flash (kbytes): 128 Kbytes
• Pin Count: 64
• Max. Operating Frequency: 60 MHz
• Cpu: 32-bit AVR
• # Of Touch Channels: 32
• Hardware Qtouch Acquisition: No
• Max I/o Pins: 44
• Ext Interrupts: 44
• Usb Transceiver: 1
• Usb Speed: Full Speed
• Usb Interface: Device + OTG
• Spi: 4
• Twi (i2c): 1
• Uart: 3
• Ssc: 1
• Graphic Lcd: No
• Video Decoder: No
• Camera Interface: No
• Adc Channels: 8
• Adc Resolution (bits): 10
• Adc Speed (ksps): 384
• Resistive Touch Screen: No
• Temp. Sensor: No
• Crypto Engine: No
• Sram (kbytes): 32
• Self Program Memory: YES
• Dram Memory: No
• Nand Interface: No
• Picopower: No
• Temp. Range (deg C): -40 to 85
• I/o Supply Class: 3.0-3.6 or (1.65-1.95+3.0-3.6)
• Operating Voltage (vcc): 3.0-3.6 or (1.65-1.95+3.0-3.6)
• Fpu: No
• Mpu / Mmu: Yes / No
• Timers: 10
• Output Compare Channels: 16
• Input Capture Channels: 6
• Pwm Channels: 13
• 32khz Rtc: Yes
• Calibrated Rc Oscillator: Yes

27.4
27.4.1
27.4.2
32059L–AVR32–01/2012
JTAG and Boundary-scan (JTAG)
Features
Overview
Rev: 2.0.1.4
•
•
•
The JTAG Interface offers a four pin programming and debug solution, including boundary-scan
support for board-level testing.
Figure 27-4 on page 583
Controller is a state machine controlled by the TCK and TMS signals. The TAP Controller
selects either the JTAG Instruction Register or one of several Data Registers as the scan chain
(shift register) between the TDI-input and TDO-output.
The Instruction Register holds JTAG instructions controlling the behavior of a Data Register. The
Device Identification Register, Bypass Register, and the boundary-scan chain are the Data Reg-
isters used for board-level testing. The Reset Register can be used to keep the device reset
during test or programming.
The Service Access Bus (SAB) interface contains address and data registers for the Service
Access Bus, which gives access to On-Chip Debug, programming, and other functions in the
device. The SAB offers several modes of access to the address and data registers, as described
in
Section 27.5
document.
IEEE1149.1 compliant JTAG Interface
Boundary-scan Chain for board-level testing
Direct memory access and programming capabilities through JTAG Interface
Section
27.4.11.
lists the supported JTAG instructions, with references to the description in this
shows how the JTAG is connected in an 32-bit AVR device. The TAP
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