ATmega32M1 Automotive Atmel Corporation, ATmega32M1 Automotive Datasheet - Page 6
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ATmega32M1 Automotive
Manufacturer Part Number
ATmega32M1 Automotive
Description
Manufacturer
Atmel Corporation
Datasheets
1.AT90CAN128_AUTOMOTIVE.pdf
(225 pages)
2.ATMEGA16M1_AUTOMOTIVE.pdf
(12 pages)
3.ATMEGA16M1_AUTOMOTIVE.pdf
(25 pages)
4.ATMEGA16M1_AUTOMOTIVE.pdf
(367 pages)
Specifications of ATmega32M1 Automotive
Flash (kbytes)
32 Kbytes
Pin Count
32
Max. Operating Frequency
16 MHz
Cpu
8-bit AVR
# Of Touch Channels
12
Hardware Qtouch Acquisition
No
Max I/o Pins
27
Ext Interrupts
27
Usb Speed
No
Usb Interface
No
Spi
1
Uart
1
Can
1
Lin
1
Graphic Lcd
No
Video Decoder
No
Camera Interface
No
Adc Channels
11
Adc Resolution (bits)
10
Adc Speed (ksps)
125
Analog Comparators
4
Resistive Touch Screen
No
Dac Channels
1
Dac Resolution (bits)
10
Temp. Sensor
Yes
Crypto Engine
No
Sram (kbytes)
2
Eeprom (bytes)
1024
Self Program Memory
YES
Dram Memory
No
Nand Interface
No
Picopower
No
Temp. Range (deg C)
-40 to 150
I/o Supply Class
2.7 to 5.5
Operating Voltage (vcc)
2.7 to 5.5
Fpu
No
Mpu / Mmu
no / no
Timers
2
Output Compare Channels
14
Input Capture Channels
1
Pwm Channels
10
32khz Rtc
No
Calibrated Rc Oscillator
Yes
2. Grade 0 Qualification
The ATmega16M1/ATmega32M1/ATmega32C1/ATmega64M1/ATmega64C1 has been devel-
oped and manufactured according to the most stringent quality assurance requirements of
ISO-TS-16949 and verified during product qualification as per AEC-Q100 grade 0.
AEC-Q100 qualification relies on temperature accelerated stress testing. High temperature field
usage however may result in less significant stress test acceleration. In order to prevent the risk
that ATmega16M1/ATmega32M1/ATmega32C1/ATmega64M1/ATmega64C1 lifetime would not
®
satisfy the application end-of-life reliability requirements, Atmel
has extended the testing,
whenever applicable (High Temperature Operating Life Test, High Temperature Storage Life,
Data Retention, Thermal Cycles), far beyond the AEC-Q100 requirements. Thereby, Atmel veri-
fied the ATmega16M1/ATmega32M1/ATmega32C1/ATmega64M1/ATmega64C1 has a long
safe lifetime period after the grade 0 qualification acceptance limits.
The valid domain calculation depends on the activation energy of the potential failure mecha-
nism that is considered. Therefore any temperature mission profile which could exceed the
AEC-Q100 equivalence domain shall be submitted to Atmel for a thorough reliability analysis
Figure 2-1.
AEC-Q100 Lifetime Equivalence
1000000
100000
10000
1000
100
10
1
0
20
40
60
80
100
120
140
160
Temperature (°C)
HTOL 0,59eV
HTSL 0,45eV
ATmega16M1/32M1/32C1/64M1/64C1 Automotive
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