ATxmega64A1 Atmel Corporation, ATxmega64A1 Datasheet - Page 90

• Manufacturer Part Number: ATxmega64A1
• Manufacturer: Atmel Corporation

Specifications of ATxmega64A1

• Flash (kbytes): 64 Kbytes
• Pin Count: 100
• Max. Operating Frequency: 32 MHz
• Cpu: 8-bit AVR
• # Of Touch Channels: 16
• Hardware Qtouch Acquisition: No
• Max I/o Pins: 78
• Ext Interrupts: 78
• Usb Speed: No
• Usb Interface: No
• Spi: 12
• Twi (i2c): 4
• Uart: 8
• Graphic Lcd: No
• Video Decoder: No
• Camera Interface: No
• Adc Channels: 16
• Adc Resolution (bits): 12
• Adc Speed (ksps): 2000
• Analog Comparators: 4
• Resistive Touch Screen: No
• Dac Channels: 4
• Dac Resolution (bits): 12
• Temp. Sensor: Yes
• Crypto Engine: AES/DES
• Sram (kbytes): 4
• Eeprom (bytes): 2048
• Self Program Memory: YES
• External Bus Interface: 1
• Dram Memory: sdram
• Nand Interface: No
• Picopower: Yes
• Temp. Range (deg C): -40 to 85
• I/o Supply Class: 1.6 to 3.6
• Operating Voltage (vcc): 1.6 to 3.6
• Fpu: No
• Mpu / Mmu: no / no
• Timers: 8
• Output Compare Channels: 24
• Input Capture Channels: 24
• Pwm Channels: 24
• 32khz Rtc: Yes
• Calibrated Rc Oscillator: Yes

35. Errata
35.1
8067M–AVR–09/10
ATxmega128A1 rev. H
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Bandgap voltage input for the ACs can not be changed when used for both ACs simultaneously
VCC voltage scaler for AC is non-linear
The ADC has up to ±2 LSB inaccuracy
ADC gain stage output range is limited to 2.4 V
Sampling speed limited to 500 ksps for supply voltage below 2.0V
ADC Event on compare match non-functional
Bandgap measurement with the ADC is non-functional when VCC is below 2.7V
Accuracy lost on first three samples after switching input to ADC gain stage
The input difference between two succeeding ADC samples is limited by VREF
Increased noise when using internal 1.0V reference at low temperature
Configuration of PGM and CWCM not as described in XMEGA A Manual
PWM is not restarted properly after a fault in cycle-by-cycle mode
BOD will be enabled at any reset
BODACT fuse location is not correct
Sampled BOD in Active mode will cause noise when bandgap is used as reference
DAC has up to ±10 LSB noise in Sampled Mode
DAC is nonlinear and inaccurate when reference is above 2.4V or VCC - 0.6V
DAC refresh may be blocked in S/H mode
Conversion lost on DAC channel B in event triggered mode
Both DFLLs and both oscillators have to be enabled for one to work
Access error when multiple bus masters are accessing SDRAM
EEPROM page buffer always written when NVM DATA0 is written
Pending full asynchronous pin change interrupts will not wake the device
Pin configuration does not affect Analog Comparator Output
Low level interrupt triggered when pin input is disabled
JTAG enable does not override Analog Comparator B output
NMI Flag for Crystal Oscillator Failure automatically cleared
Flash Power Reduction Mode can not be enabled when entering sleep
Some NVM Commands are non-functional
Crystal start-up time required after power-save even if crystal is source for RTC
Setting PRHIRES bit makes PWM output unavailable
Accessing EBI address space with PREBI set will lock Bus Master
RTC Counter value not correctly read after sleep
Pending asynchronous RTC-interrupts will not wake up device
TWI, the minimum I2C SCL low time could be violated in Master Read mode
TWI address-mask feature is non-functional
TWI, a general address call will match independent of the R/W-bit value
TWI Transmit collision flag not cleared on repeated start
Clearing TWI Stop Interrupt Flag may lock the bus
TWI START condition at bus timeout will cause transaction to be dropped
TWI Data Interrupt Flag erroneously read as set
WDR instruction inside closed window will not issue reset
XMEGA A1
90