AD5622 Analog Devices, AD5622 Datasheet - Page 14

• Manufacturer Part Number: AD5622
• Description: 2.7 V to 5.5 V,
• Manufacturer: Analog Devices

Specifications of AD5622

• Resolution (bits): 12bit
• Dac Update Rate: 1.7MSPS
• Dac Settling Time: 6µs
• Max Pos Supply (v): +5.5V
• Single-supply: Yes
• Dac Type: Voltage Out
• Dac Input Format: I2C/Ser 2-wire,Ser

AD5602/AD5612/AD5622
TERMINOLOGY
Relative Accuracy
For the DAC, relative accuracy or integral nonlinearity (INL) is
a measure of the maximum deviation, in LSBs, from a straight
line passing through the endpoints of the DAC transfer
function. A typical INL vs. code plot can be seen in Figure 4.
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of ±1 LSB maximum
ensures monotonicity. This DAC is guaranteed monotonic by
design. A typical DNL vs. code plot can be seen in Figure 5.
Zero Code Error
Zero-code error is due to a combination of the offset errors in
the DAC and output amplifier; it is a measure of the output
error when zero code (0x0000) is loaded to the DAC register.
Ideally, the output should be 0 V. The zero-code error is always
positive in the AD5602/AD5612/AD5622 because the output of
the DAC cannot go below 0 V. Zero-code error is expressed in
mV. A plot of zero-code error vs. temperature can be seen in
Figure 17.
Full-Scale Error
Full-scale error is a measure of the output error when full-scale
code (0xFFFF) is loaded to the DAC register; it is expressed in
percent of full-scale range. Ideally, the output should be V
1 LSB. A plot of full-scale error vs. temperature can be seen in
Figure 17.
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Gain Error
Gain error is a measure of the span error of the DAC. It is the
deviation in slope of the DAC transfer characteristic from ideal
expressed as a percent of the full-scale range.
Total Unadjusted Error (TUE)
Total unadjusted error is a measure of the output error taking
all the various errors into account. A typical TUE vs. code plot
can be seen in Figure 10.
Zero Code Error Drift
Zero code error drift is a measure of the change in zero code
error with a change in temperature. It is expressed in μV/°C.
Gain Error Drift
Gain error drift is a measure of the change in gain error with
changes in temperature. It is expressed in (ppm of full-scale
range)/°C.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nV-s and
is measured when the digital input code is changed by 1 LSB at
the major carry transition (0x7FFF to 0x8000) (see Figure 32).
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into
the analog output of the DAC from the digital inputs of the DAC,
but is measured when the DAC output is not updated. It is
specified in nV-s and measured with a full-scale code change on
the data bus, that is, from all 0s to all 1s, and vice versa
(see Figure 33).