FQN1N50C Fairchild Semiconductor, FQN1N50C Datasheet

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FQN1N50C

Manufacturer Part Number
FQN1N50C
Description
Manufacturer
Fairchild Semiconductor
Datasheet

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©2006 Fairchild Semiconductor Corporation
FQN1N50C Rev. A
FQN1N50C
500V N-Channel MOSFET
Features
• 0.38 A, 500 V, R
• Low gate charge ( typical 4.9 nC )
• Low Crss ( typical 4.1 pF)
• Fast switching
• 100 % avalanche tested
• Improved dv/dt capability
Absolute Maximum Ratings
Thermal Characteristics
V
I
I
V
E
I
E
dv/dt
P
T
T
R
R
D
DM
AR
Symbol
Symbol
J
L
DSS
GSS
AS
AR
D
θJL
θJA
, T
STG
Drain-Source Voltage
Drain Current
Drain Current
Gate-Source Voltage
Single Pulsed Avalanche Energy
Avalanche Current
Repetitive Avalanche Energy
Peak Diode Recovery dv/dt
Power Dissipation (T
Power Dissipation (T
Operating and Storage Temperature Range
Maximum lead temperature for soldering purposes,
1/8" from case for 5 seconds
Thermal Resistance, Junction-to-Lead
Thermal Resistance, Junction-to-Ambient
DS(on)
= 6.0 Ω @ V
G
D
S
- Continuous (T
- Continuous (T
- Pulsed
- Derate above 25°C
A
L
Parameter
Parameter
= 25°C)
= 25°C)
GS
= 10 V
C
C
TO-92
FQN Series
= 25°C)
= 100°C)
(Note 1)
(Note 2)
(Note 1)
(Note 1)
(Note 3)
(Note 6a)
(Note 6b)
1
Description
These N-Channel enhancement mode power field effect
transistors are produced using Fairchild’s proprietary, planar
stripe, DMOS technology.
This advanced technology has been especially tailored to
minimize on-state resistance, provide superior switching
performance, and withstand high energy pulse in the avalanche
and commutation mode. These devices are well suited for high
efficiency switched mode power supplies, active power factor
correction, electronic lamp ballasts based on half bridge
topology.
G
Typ
--
--
FQN1N50C
-55 to +150
0.017
S
0.38
0.24
3.04
± 30
44.4
0.38
0.21
0.89
2.08
500
300
4.5
D
Max
140
60
QFET
January 2006
www.fairchildsemi.com
Units
Units
W/°C
°C/W
°C/W
V/ns
mJ
mJ
°C
°C
W
W
V
A
A
A
V
A
®

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FQN1N50C Summary of contents

Page 1

... R Thermal Resistance, Junction-to-Lead θJL R Thermal Resistance, Junction-to-Ambient θJA ©2006 Fairchild Semiconductor Corporation FQN1N50C Rev. A Description = 10 V These N-Channel enhancement mode power field effect GS transistors are produced using Fairchild’s proprietary, planar stripe, DMOS technology. This advanced technology has been especially tailored to ...

Page 2

... JL b) When mounted on 3”x4.5” FR-4 PCB without any pad copper in a still air environment (R is the sum of the junction-to-case and case-to-ambient thermal resistance. R θ JA FQN1N50C Rev. A Package Reel Size TO- 25°C unless otherwise noted C Test Conditions = 250 µ ...

Page 3

... Drain Current [A] D Figure 5. Capacitance Characteristics 400 300 C oss C iss 200 C 100 rss Drain-Source Voltage [V] DS FQN1N50C Rev. A Figure 2. Transfer Characteristics 0 10 Notes : ※ 1. 250µ s Pulse Test ℃ Figure 4. Body Diode Forward Voltage V = 10V ...

Page 4

... Single Pulse - Drain-Source Voltage [ FQN1N50C Rev. A (Continued) Figure 8. On-Resistance Variation 3.0 2.5 2.0 1.5 1.0 ※ Notes : 0 250 µA D 0.0 -100 100 150 200 o C] Figure 10. Maximum Drain Current ...

Page 5

... Unclamped Inductive Switching Test Circuit & Waveforms FQN1N50C Rev. A Gate Charge Test Circuit & Waveform Resistive Switching Test Circuit & Waveforms 5 www.fairchildsemi.com ...

Page 6

... Peak Diode Recovery dv/dt Test Circuit & Waveforms FQN1N50C Rev www.fairchildsemi.com ...

Page 7

... Mechanical Dimensions ±0.10 0.46 1.27TYP ±0.20 [1.27 FQN1N50C Rev. A TO-92 +0.25 4.58 –0.15 1.27TYP ±0.20 ] [1.27 ] 3.60 ±0.20 (R2.29) 7 +0.10 0.38 –0.05 Dimensions in Millimeters www.fairchildsemi.com ...

Page 8

... TRADEMARKS The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended exhaustive list of all such trademarks. FAST ® ACEx™ ActiveArray™ FASTr™ Bottomless™ FPS™ Build it Now™ FRFET™ CoolFET™ ...

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