N74F367N,602 NXP Semiconductors, N74F367N,602 Datasheet - Page 5
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N74F367N,602
Manufacturer Part Number
N74F367N,602
Description
IC BUFFER DVR HEX N-INV 16PDIP
Manufacturer
NXP Semiconductors
Series
74Fr
Datasheet
1.N74F367D602.pdf
(9 pages)
Specifications of N74F367N,602
Package / Case
16-DIP (0.300", 7.62mm)
Logic Type
Buffer/Line Driver, Non-Inverting
Number Of Elements
2
Number Of Bits Per Element
2, 4 (Hex)
Current - Output High, Low
15mA, 64mA
Voltage - Supply
4.5 V ~ 5.5 V
Operating Temperature
0°C ~ 70°C
Mounting Type
Through Hole
Logic Family
F
Number Of Channels Per Chip
6
Polarity
Non-Inverting
Supply Voltage (max)
5.5 V
Supply Voltage (min)
4.5 V
Maximum Operating Temperature
+ 70 C
Mounting Style
SMD/SMT
High Level Output Current
- 15 mA
Low Level Output Current
64 mA
Minimum Operating Temperature
0 C
Output Type
3-State
Propagation Delay Time
5 ns
Number Of Lines (input / Output)
6 / 6
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
Other names
568-3179-5
933747090602
N74F367N
933747090602
N74F367N
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
3. Not more than one output should be shorted at a time. For testing I
Philips Semiconductors
DC ELECTRICAL CHARACTERISTICS
Over recommended operating free-air temperature range unless otherwise noted.
NOTES:
AC ELECTRICAL CHARACTERISTICS
2004 Jan 30
SYMBOL
SYMBOL
V
V
V
V
V
I
I
I
I
I
I
I
SYMBOL
t
t
t
t
t
t
I
IH
IL
OZH
OZL
OS
CC
PLH
PHL
PZH
PZL
PHZ
PLZ
Hex buffer/driver
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged
shorting of a HIGH output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests.
In any sequence of parameter tests, I
O
OH
O
OL
IK
HIGH level output voltage
HIGH-level output voltage
Low level output voltage
Low-level output voltage
Input clamp voltage
Input current at maximum input voltage
HIGH-level input current
LOW-level input current
Off-state output current,
HIGH-level voltage applied
Off-state output current,
LOW-level voltage applied
Short-circuit output current
Supply current (total)
Propagation delay
I
Output Enable time
to HIGH or LOW level
Output Disable time
from HIGH to LOW level
n
to Y
n
PARAMETER
PARAMETER
PARAMETER
CC
= 5 V, T
amb
OS
3
= 25 C.
tests should be performed last.
I
I
I
CCH
CCL
CCZ
TEST CONDITIONS
Waveform 1
Waveform 2
Waveform 3
Waveform 2
Waveform 3
V
V
V
V
V
IH
V
CC
CC
IH
CC
CC
CC
CC
IH
= MIN; I
= MIN; I
= MIN; V
= MIN; V
= MIN; V
= MIN; I
V
V
V
V
TEST CONDITIONS
TEST CONDITIONS
V
CC
CC
CC
CC
OS
V
CC
5
OH
CC
OH
= MAX; V
, the use of high-speed test apparatus and/or sample-and-hold
= MAX; V
OL
= MAX; V
= MAX; V
IL
IL
IL
IL
IL
IL
= 0 V; V
V
V
= –15 mA
MIN
= MIN; I
CC
CC
C
= –3 mA
2.5
2.5
3.0
3.0
2.0
2.0
= MAX;
= MAX;
= MAX;
= MAX
L
= MAX
= MAX
= 50 pF; R
T
V
amb
I
O
CC
O
I
I
= 7.0 V
I
= 2.7 V
= 0.5 V
= 0.5 V
= I
= 2.7 V
TYP
= +5.0 V
= +25 C
4.5
5.5
5.5
6.5
4.5
4.0
IK
1
1
L
= 500
10% V
10% V
10% V
5% V
5% V
5% V
MAX
6.5
7.0
7.5
8.5
6.5
6.5
CC
CC
CC
CC
CC
CC
LIMITS
T
–100
MIN
C
2.4
2.7
2.0
2.0
amb
–
–
–
–
–
–
–
–
–
–
–
L
V
MIN
2.0
2.0
3.0
3.0
2.0
2.0
CC
= 50 pF; R
= –55 C to +125 C
= +5.0 V
LIMITS
–0.73
TYP
0.42
3.3
25
47
35
–
–
–
–
–
–
–
–
–
–
2
L
= 500
MAX
10%
7.0
7.5
8.5
9.0
7.0
7.0
MAX
–225
0.55
0.55
–1.2
100
–20
–50
20
35
62
48
50
74F367
–
–
–
–
Product data
UNIT
UNIT
mA
mA
mA
mA
ns
ns
ns
ns
ns
ns
V
V
V
V
V
V
V
A
A
A
A
A