CM28C010-120 Maxwell Technologies, Inc., CM28C010-120 Datasheet - Page 12

• Manufacturer Part Number: CM28C010-120
• Description: Microcircuit Memory Digital CMOS 128k x 8-Bit EEPROM Monolithic Silicon
• Manufacturer: Maxwell Technologies, Inc.

DSCC FORM 2234
R
R
Reset protect time
Reset high time
Time to device busy
1/ Connect all address inputs and O
2/ A functional test shall verify the dc input and output levels and applicable patterns as appropriate, all input
3/ All pins not being tested are to be open.
4/ Tested initially and after any design or process changes which may affect that parameter, and therefore shall be
5/ Tested by application of specified timing signals and conditions.
6/ Chip erase functions are applicable to device types 01-15 only.
7/ This parameter not applicable for internal timer controlled devices.
8/ R
APR 97
E
E
and I/O pins shall be tested. Terminal conditions are as follows:
S
S
Terminal conditions for the output leakage current test shall be as follows:
guaranteed to the limits specified in table I.
E
low to output float
to output delay
a.
b.
c.
a.
b.
Equivalent ac test conditions:
Test
S
Output load, see figure 5; input rise and fall times  10 ns; input pulse levels, 0.4 V and 2.4 V; timing measurement
reference levels, inputs, 1.5 V for device types 1-15 and 1 V and 2 V for device types 16-19; outputs, 1.5 V for device types
1-15 and 0.8 V and 2 V for device types 16-19.
functions are applicable to device types 16-19 only.
Measure the leakage current while applying the specified voltage.
Measure the leakage current while applying the specified voltage.
DEFENSE SUPPLY CENTER COLUMBUS
V
For I
For I
Inputs: H =2.0 V for device types 01-15 and 2.2 V for device types 16-19; L = 0.8 V. Outputs: H = 2.4 V minimum and
L = 0.4 V maximum.
The functional tests shall be performed with V
IH
= 2.0 V for device types 01-15 and 2.2 V for device types 16-19; V
OZL
OZH
COLUMBUS, OHIO 43216-5000
MICROCIRCUIT DRAWING
: Select an appropriate address to acquire a logic "1" on the designated output. Apply V
: Select an appropriate address to acquire a logic "0" on the designated output. Apply V
STANDARD
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|Symbol
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|
|
|t
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|
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|t
|
|
|t
|
|
|t
|
|
|t
|
DFR
RR
RP
RES
DB
TABLE I. Electrical performance characteristics - Continued.
E
to V
|
|
| -55 ( C  T  +125 ( C
| V
|
|
|See figures 4, 5, and 6 as
| applicable. 5/ 8/
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|
IH
SS
unless otherwise specified
and measure I
= 0 V; 4.5 V  V
Conditions
C
CC
= 4.5 and V
OZL
CC
and I
 5.5 V
OZH
SIZE
CC
A
= 5.5 V.
with the output under test connected to V
|
| Group A
|subgroups | types
|
|
|
|9, 10, 11
|
|
|
|9, 10, 11
|
|
|9, 10, 11
|
|
|9, 10, 11
|
|
|9, 10, 11
|
IL
REVISION LEVEL
= 0.8 V.
|
| Device
|
|
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| 16-19
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|
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| 16-19
|
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| 16-19
|
|
| 16-19
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| 16-19
|
G
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| Min
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|
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| 100
|
|
| 1.0
|
|
| 120
|
0
0
Limits
IH
IH
SHEET
to C
to C
|
| Max
|
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| 350
|
|
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| 450
|
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|
5962-38267
E
E
.
.
OUT
12
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| Unit
|
|
|
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| ns
|
|
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| ns
|
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| µs
|
|
| µs
|
|
| ns
|
.