CM28C010-120 Maxwell Technologies, Inc., CM28C010-120 Datasheet - Page 4

• Manufacturer Part Number: CM28C010-120
• Description: Microcircuit Memory Digital CMOS 128k x 8-Bit EEPROM Monolithic Silicon
• Manufacturer: Maxwell Technologies, Inc.

DSCC FORM 2234
APR 97
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the
issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the
solicitation.
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094).
otherwise specified, the issues of the documents which are DoD adopted are those listed in the issue of the DODISS cited in the
solicitation. Unless otherwise specified, the issues of documents not listed in the DODISS are the issues of the documents cited
in the solicitation.
Race Street, Philadelphia, PA 19103).
VA 22201).
the documents. These documents also may be available in or through libraries or other informational services).
this drawing shall take precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
SPECIFICATION
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
STANDARDS
HANDBOOKS
(Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization
2.2 Non-Government publications. The following documents form a part of this document to the extent specified herein. Unless
AMERICAN SOCIETY FOR TESTING AND MATERIALS (ASTM)
ASTM Standard F1192-88
ELECTRONICS INDUSTRIES ASSOCIATION (EIA)
2.3 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of
DEPARTMENT OF DEFENSE
DEPARTMENT OF DEFENSE
MIL-HDBK-103 -
MIL-HDBK-780 -
DEPARTMENT OF DEFENSE
MIL-STD-883 -
MIL-STD-1835 -
JEDEC Standard EIA/JESD78 - I/C Latch-up Test.
(Applications for copies should be addressed to the Electronics Industries Association, 2500 Wilson Boulevard, Arlington,
(Non-Government standards and other publications are normally available from the organizations that prepare or distribute
(Applications for copies of ASTM publications should be addressed to the American Society for Testing and Materials, 1916
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
MICROCIRCUIT DRAWING
STANDARD
Test Method Standard Microcircuits.
Interface Standard for Microcircuit Case Outlines.
List of Standard Microcircuit Drawings.
Standard Microcircuit Drawings.
-
Standard Guide for the Measurement of Single Event Phenomena from
Heavy Ion Irradiation of Semiconductor Devices.
SIZE
A
REVISION LEVEL
G
SHEET
5962-38267
4