HY27SF082G2B Hynix Semiconductor, HY27SF082G2B Datasheet - Page 20

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HY27SF082G2B

Manufacturer Part Number
HY27SF082G2B
Description
2gb Nand Flash
Manufacturer
Hynix Semiconductor
Datasheet
Rev 0.3 / Feb. 2008
Input / Output Capacitance
Input Capacitance
Program Time / Multi-Plane Program Time
Dummy Busy Time for Two Plane Program
Number of partial Program Cycles in the same page
Block Erase Time / Multi-Plane Block Erase Time
Read Cache Busy Time
Item
Table 12: Program / Erase Characteristics
Table 11: Pin Capacitance (TA=25C, F=1.0MHz)
Parameter
Symbol
C
C
I/O
IN
2Gbit (256Mx8bit/128Mx16bit) NAND Flash
Test Condition
V
V
IN
IL
=0V
=0V
Symbol
HY27SF(08/16)2G2B Series
t
t
t
t
NOP
PROG
DBSY
BERS
RBSY
Min
Min
-
-
-
-
-
-
-
Typ
250
0.5
2
3
-
Max
10
10
Max
700
2.5
tR
1
8
Unit
Cycles
pF
pF
Unit
ms
us
us
us
20

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