HY27SF082G2B Hynix Semiconductor, HY27SF082G2B Datasheet - Page 46

• Manufacturer Part Number: HY27SF082G2B
• Description: 2gb Nand Flash
• Manufacturer: Hynix Semiconductor

HY27SF(08/16)2G2B Series
2Gbit (256Mx8bit/128Mx16bit) NAND Flash
Bad Block Management
Devices with Bad Blocks have the same quality level and the same AC and DC characteristics as devices where all the
blocks are valid. A Bad Block does not affect the performance of valid blocks because it is isolated from the bit line and
common source line by a select transistor. The devices are supplied with all the locations inside valid blocks erased(FFh).
The Bad Block Information is written prior to shipping. Any block where the 1st Byte(1st word) in the spare area of the
1st or 2nd th page (if the 1st page is Bad) does not contain FFh is a Bad Block. The Bad Block Information must be read
before any erase is attempted as the Bad Block Information may be erased. For the system to be able to recognize the
Bad Blocks based on the original information it is recommended to create a Bad Block table following the flowchart
shown in Figure 29. The 1st block, which is placed on 00h block address is guaranteed to be a valid block.
Figure 29: Bad Block Management Flowchart
Rev 0.3 / Feb. 2008
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