MBM29LV400TC Fujitsu Microelectronics, Inc., MBM29LV400TC Datasheet - Page 31
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MBM29LV400TC
Manufacturer Part Number
MBM29LV400TC
Description
4m 512k X 8/256k X 16 Bit
Manufacturer
Fujitsu Microelectronics, Inc.
Datasheet
1.MBM29LV400TC.pdf
(58 pages)
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Note: Test Conditions:
JEDEC
• Read Only Operations Characteristics
AC CHARACTERISTICS
t
t
t
t
t
t
t
GHQZ
AVQV
ELQV
GLQV
EHQZ
AXQX
AVAV
—
—
Parameter
Symbols
Output Load: 1 TTL gate and 30 pF (MBM29LV400TC/BC-70)
Input rise and fall times: 5 ns
Input pulse levels: 0.0 V to 3.0 V
Timing measurement reference level
Standard
Output:1.5 V
Input: 1.5 V
Notes: C
t
t
READY
t
MBM29LV400TC
t
t
t
t
ELFL
ELFH
t
t
t
ACC
OH
RC
CE
OE
DF
DF
1 TTL gate and 100 pF (MBM29LV400TC/BC-90/-12)
C
L
L
= 30 pF including jig capacitance (MBM29LV400TC/BC-70)
= 100 pF including jig capacitance (MBM29LV400TC/BC-90/-12)
Read Cycle Time
Address to Output Delay
Chip Enable to Output Delay
Output Enable to Output Delay
Chip Enable to Output High-Z
Output Enable to Output High-Z
Output Hold Time From
Addresses,
CE or OE, Whichever Occurs First
RESET Pin Low to Read Mode
CE or BYTE Switching Low or
High
Description
Device
Under
Test
Figure 4
-70/-90/-12
C
L
Test Conditions
CE = V
OE = V
OE = V
Test Setup
/MBM29LV400BC
—
—
—
—
—
—
—
IN3064
or Equivalent
IL
6.2 k
IL
IL
Max.
Max.
Max.
Max.
Max.
Max.
Max.
Min.
Min.
3.3 V
(Note)
-70
70
70
70
30
25
25
20
0
5
2.7 k
(Note)
Diodes = IN3064
or Equivalent
-90
90
90
90
35
30
30
20
0
5
(Note)
120
120
120
-12
50
30
30
20
-70/-90/-12
0
5
Unit
ns
ns
ns
ns
ns
ns
ns
ns
s
31