ISL3178E Intersil Corporation, ISL3178E Datasheet - Page 8

• Manufacturer Part Number: ISL3178E
• Description: (ISL3170E - ISL3178E) RS-485/RS-422 Transceivers
• Manufacturer: Intersil Corporation

Electrical Specifications
NOTES:
10. Keep RE = VCC, and set the DE signal low time >600ns to ensure that the device enters SHDN.
12. Does not apply to the ISL3171E, ISL3174E and ISL3177E.
13. Δt
14. ISL3170E - ISL3175E only.
15. V
16. Guaranteed by design and characterization, but not production tested.
17. If the Tx or Rx enable function isn’t needed, connect the enable pin to the appropriate supply (see “Pin Descriptions” table) through a 1kΩ to 3kΩ
11. Set the RE signal high time >600ns to ensure that the device enters SHDN.
Test Circuits and Waveforms
ISL3170E, ISL3171E, ISL3172E, ISL3173E, ISL3174E, ISL3175E, ISL3176E, ISL3177E, ISL3178E
Receiver Disable from Output Low
Time to Shutdown
Receiver Enable from Shutdown to
Output High
Receiver Enable from Shutdown to
Output Low
4. All currents into device pins are positive; all currents out of device pins are negative. All voltages are referenced to device ground unless otherwise
5. Supply current specification is valid for loaded drivers when DE = 0V.
6. Applies to peak current. See “Typical Performance Curves” for more information.
7. When testing devices with the shutdown feature, keep RE = 0 to prevent the device from entering SHDN.
8. When testing devices with the shutdown feature, the RE signal high time must be short enough (typically <100ns) to prevent the device from
9. Versions with a shutdown feature are put into shutdown by bringing RE high and DE low. If the inputs are in this state for less than 50ns, the parts
specified.
entering SHDN.
are guaranteed not to enter shutdown. If the inputs are in this state for at least 600ns, the parts are guaranteed to have entered shutdown. See
“Low-Power Shutdown Mode” section.
temperature, etc.). Only applies to the ISL3176E - 78E.
resistor.
CC
SKEW
V
CC
≥ 3.15V
PARAMETER
is the magnitude of the difference in propagation delays of the specified terminals of two units tested with identical test conditions (V
DE
DI
FIGURE 1A. V
D
Z
Y
8
OD
V
Test Conditions: V
Note 4 (Continued)
OD
t
t
SYMBOL
ZH(SHDN)
ZL(SHDN)
AND V
t
SHDN
t
LZ
OC
R
R
L
L
/2
/2
R
SW = V
(Note 12)
(Notes 9, 12)
R
(Notes 9, 11, 12)
R
(Notes 9, 11, 12)
FIGURE 1. DC DRIVER TEST CIRCUITS
L
L
L
CC
= 1kΩ, C
= 1kΩ, C
= 1kΩ, C
V
OC
= 3.0V to 3.6V; Unless Otherwise Specified. Typicals are at V
CC
(Figure 6),
L
L
L
TEST CONDITIONS
= 15pF,
= 15pF, SW = GND (Figure 6),
= 15pF, SW = V
ISL3170E-75E
ISL3176E-78E
V
CC
CC
(Figure 6),
DE
DI
FIGURE 1B. V
D
Z
Y
TEMP
(°C)
Full
Full
Full
Full
Full
OD
WITH COMMON MODE LOAD
V
OD
MIN
50
5
4
-
-
CC
R
TYP
= 3.3V, T
180
240
240
L
13
7
= 60Ω
MAX
A
600
500
500
20
15
= +25°C,
375Ω
375Ω
August 28, 2006
-7V to +12V
FN6307.2
UNITS
V
ns
ns
ns
ns
ns
CM
CC
,