IDT71P72804 Integrated Device Technology, IDT71P72804 Datasheet - Page 11

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IDT71P72804

Manufacturer Part Number
IDT71P72804
Description
1.8v 1m X 18 Qdr Ii Pipelined Sram
Manufacturer
Integrated Device Technology
Datasheet

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AC Test Conditions
NOTE:
1. Parameters are tested with RQ=250
Input Waveform
(V
Output Waveform
AC Test Load
71P72804 (1M x 18-Bit) 71P72604 (512K x 36-Bit)
18 Mb QDR II SRAM Burst of 2
Core Power Supply Voltage
I/O Power Supply Voltage
Input High Level
Input Low Level
Input Reference Level
Input Rise/Fall Time
Output Timing Reference Level
(V
DDQ
DDQ
/2) + 0.5V
/2) - 0.5V
OUTPUT
Device
Under
Test
Parameter
V
V
REF
DDQ
ZQ
/2
V
DDQ
V
Z
R
Test points
DDQ
0
Q
/2
=50
/2
Symbol
= 250
VREF
TR/TF
V
V
V
V
DDQ
DD
IH
IL
Test points
(1)
6109 drw 04
(V
V
(V
V
1.4 to V
6109 drw 06a
1.7 to 1.9
DDQ
DDQ
DDQ
DDQ
V
V
0.3/0.3
Value
DDQ
DDQ
V
/2)+ 0.5
/2
/2)- 0.5
6109 drw 06
/2
DDQ
R
/2
/2
DD
L
/2
= 50
6109tbl 11a
Unit
ns
V
V
V
V
V
V
6.42
11
Commercial and IndustrialTemperature Range

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