IDT71P72804 Integrated Device Technology, IDT71P72804 Datasheet - Page 17

• Manufacturer Part Number: IDT71P72804
• Description: 1.8v 1m X 18 Qdr Ii Pipelined Sram
• Manufacturer: Integrated Device Technology

JTAG Input Test WaveForm
JTAG Output Test WaveForm
JTAG DC Operating Conditions
JTAG AC Test Conditions
NOTE:
1. For SRAM outputs see AC test load on page 11.
1.8 V
NOTE:
1. The output impedance of TDO is set to 50 ohms (nominal process) and does not vary with the external
resistor connected to ZQ.
71P72804 (1M x 18-Bit) 71P72604 (512K x 36-Bit)
18 Mb QDR II SRAM Burst of 2
I/O Power Supply
Power Supply Voltage
Input High Level
Input Low Level
Output High Voltage (I
Output Low Voltage (I
Input High Level
Input Low Level
Input Rise/Fall Time
Input and Output Timing Reference Level
TCK Input Leakage Current
TMS, TDI Input Leakage Current
TDO Output Leakage Current
0 V
Parameter
Parameter
0.9 V
0.9 V
OH
OL
= -1mA)
= 1mA)
Test points
Test points
Symbol
V
V
V
V
V
V
DDQ
I
I
I
0L
DD
IL
IL
OH
OL
IH
IL
Symbol
TR/TF
V
V
IH
IL
V
DDQ -
V
-0.3
Min
-15
1.4
1.7
1.3
-5
-5
6109 drw 23a
SS
0.9 V
1.0/1.0
Value
6109 drw 23
0.2
0.9
0.9 V
1.8
0
Typ
1.8
Unit
-
-
-
-
-
-
-
-
ns
V
V
V
6109 tbl 20
Note
V
1
DD
V
Max
V
+15
0.5
0.2
1.9
+5
+5
DDQ
6.42
DD
+0.3
17
JTAG AC Test Load
Unit
V
V
V
V
V
V
TDO
A
A
A
6109 tbl 19
Note
1
1
Commercial and IndustrialTemperature Range
Z
0
= 50
6109 drw 24
0.9 V
50
,