SMP80MC STMicroelectronics, SMP80MC Datasheet - Page 6

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SMP80MC

Manufacturer Part Number
SMP80MC
Description
TRISIL
Manufacturer
STMicroelectronics
Datasheet

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Characteristics
6/10
Figure 10. Test circuit 2 for IBO and VBO parameters
Figure 11. Test circuit 3 for dynamic IH parameter
220V 50Hz
TEST PROCEDURE
Pulse test duration (tp = 20ms):
V
This is a GO-NOGO test which allows to confirm the holding current (I ) level in a
functional test circuit.
TEST PROCEDURE
1/ Adjust the current level at the I value by short circuiting the AK of the D.U.T.
2/ Fire the D.U.T. with a surge current
3/ The D.U.T. will come back off-state within 50ms maximum.
OUT
for Bidirectional devices = Switch K is closed
for Unidirectional devices = Switch K is open
Device with V
Device with V
selection:
V
BAT
= - 48 V
BO
BO
< 200V
200V
V
V
OUT
OUT
1/4
R
H
= 250 V
= 480 V
➔ I
ton = 20ms
Vout
RMS
RMS
PP
, R2 = 240
, R1 = 140
= 10A, 10/1000µs.
K
Ω
Ω
D.U.T
measurement
IBO
R1 = 140Ω
R2 = 240Ω
DUT
H
generator
Surge
measurement
VBO
SMP80MC

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