B133XW03-V4 AUO, B133XW03-V4 Datasheet - Page 23

• Manufacturer Part Number: B133XW03-V4
• Description: TFT LCD Module
• Manufacturer: AUO

7. Panel Reliability Test
7.1 Vibration Test
7.2 Shock Test
7.3 Reliability Test
B133XW03 V4
Test Spec:
Test Spec:
Note1: According to EN 61000-4-2 , ESD class B: Some performance degradation allowed. Self-recoverable.
Remark: MTBF (Excluding the LED): 30,000 hours with a confidence level 90%
High Temperature
High Temperature
Low Temperature
Low Temperature
Thermal Shock
Test method: Non-Operation
Acceleration: 1.5 G
Frequency:
Sweep:
Test method: Non-Operation
Acceleration: 220 G , Half sine wave
Active time:
Pulse:
Humidity Bias
Temperature
No data lost, No hardware failures.
Operation
Operation
Document Version : 0.1
Storage
Storage
Items
Test
ESD
10 - 500Hz Random
30 Minutes each Axis (X, Y, Z)
2 ms
X,Y,Z .one time for each side
Ta= 40℃ ℃ ℃ ℃ , 90%RH, 300h
Ta= 50℃ ℃ ℃ ℃ , Dry, 300h
Ta= 0℃ ℃ ℃ ℃ , 300h
Ta= 60℃ ℃ ℃ ℃ , 35%RH, 300h
Ta= -20℃ ℃ ℃ ℃ , 50%RH, 250h
Ta=-20℃ ℃ ℃ ℃ to 60℃ ℃ ℃ ℃ , Duration at 30 min, 100 cycles
Contact : ±8 KV
Air : ±15 KV
Product Specification
AU OPTRONICS CORPORATION
Required Condition
www.DataSheet.co.kr
Note 1
Note
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