DS21Q59 Maxim Integrated Products, DS21Q59 Datasheet
DS21Q59
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DS21Q59 Summary of contents
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... RELIABILITY REPORT FOR DS21Q59, Rev A2 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com ph: 972-371-3726 fax: 972-371-6016 mbl: 214-435-6610 02/03/2004 ...
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... Failure rate data from the operating life test is reported using a Chi-Squared statistical model at the 60% or 90% confidence level (Cf). The failure rate, Fr, is related to the acceleration during life test by X/(ts * AfV * AfT * Chi-Sq statistical upper limit N = Life test sample size DS21Q59, Rev A2 ...
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Failure Rates are reported in FITs (Failures in Time) or MTTF (Mean Time To Failure). The FIT rate is related to MTTF by: MTTF = 1/Fr NOTE: MTTF is frequently used interchangeably with MTBF. The calculated failure rate for this ...
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STORAGE LIFE 0305 STORAGE LIFE 0309 STORAGE LIFE 0312 STORAGE LIFE 0312 STORAGE LIFE 0312 STORAGE LIFE 0330 TEMPERATURE CYCLE DESCRIPTION DATE CODE TEMP CYCLE 0305 TEMP CYCLE 0309 TEMP CYCLE 0310 TEMP CYCLE 0312 TEMP CYCLE 0312 TEMP CYCLE ...