DS21Q59 Maxim Integrated Products, DS21Q59 Datasheet - Page 3

• Manufacturer Part Number: DS21Q59
• Description: RELIABILITY REPORT FOR DS21Q59/ REV A2
• Manufacturer: Maxim Integrated Products

Failure Rates are reported in FITs (Failures in Time) or MTTF (Mean Time To Failure). The FIT rate
is related to MTTF by:
The calculated failure rate for this device/process is:
The parameters used to calculate this failure rate are as follows:
The reliability data follows. A the start of this data is the device information. The next section is the
detailed reliability data for each stress. The reliability data section includes the latest data available.
Device Information:
ELECTRICAL CHARACTERIZATION
DESCRIPTION
ESD SENSITIVITY
ESD SENSITIVITY
ESD SENSITIVITY
ESD SENSITIVITY
ESD SENSITIVITY
LATCH-UP
LATCH-UP
OPERATING LIFE
DESCRIPTION
HIGH VOLTAGE LIFE
HIGH VOLTAGE LIFE
HIGH VOLTAGE LIFE
HIGH TEMP OP LIFE
HIGH TEMP OP LIFE
STORAGE LIFE
DESCRIPTION
Process:
Passivation:
Die Size:
Number of Transistors:
Interconnect:
Gate Oxide Thickness:
MTTF = 1/Fr
NOTE: MTTF is frequently used interchangeably with MTBF.
FAILURE RATE:
Cf: 60%
DATE CODE
0311
0311
0311
0311
0311
0311
0311
DATE CODE
0227
0307
0310
0311
0312
DATE CODE
Ea: 0.7
D6H-2P2M,HPVt,TCZ ALOCOS:GOI
Laser/TEOS Ox - Pass/Nit - Gen.LaserPrb
409 x 407
800000
Aluminum / 1% Silicon / 0.5% Copper
150 Å
CONDITION
EOS/ESD S5.1 HBM 500 VOLTS
EOS/ESD S5.1 HBM 1000 VOLTS
EOS/ESD S5.1 HBM 2000 VOLTS
EOS/ESD S5.1 HBM 4000 VOLTS
EOS/ESD S5.1 HBM 8000 VOLTS
JESD78, I-TEST 125C
JESD78, Vsupply TEST 125C
CONDITION
125C, 6.0 VOLTS
125C, 6.0 VOLTS
125C, 6.0 VOLTS
125C, 3.5 VOLTS
125C, 3.3 VOLTS
CONDITION
MTTF (YRS): 41831
B: 0
Tu: 25
FITS: 2.7
°C
READPOINT
1
1
1
1
1
READPOINT
1000
1000
1000
1000
1000
READPOINT
PUL'S
PUL'S
PUL'S
PUL'S
PUL'S
HRS
HRS
HRS
HRS
HRS
Vu: 5.5
Total:
Total:
QUANTITY
QUANTITY
QUANTITY
Volts
77
77
80
77
45
3
3
3
3
3
6
6
FAILS
FAILS
FAILS
0
0
0
0
3
0
0
3
0
0
0
0
0
0