SG243200CNCWA-T1 DATA IMAGE, SG243200CNCWA-T1 Datasheet - Page 20

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SG243200CNCWA-T1

Manufacturer Part Number
SG243200CNCWA-T1
Description
LCD_Module
Manufacturer
DATA IMAGE
Datasheet
Confidential Document
12.3 Sampling Condition
Class of
defects
4
Inspection level: Level II
Sampling type: normal inspection, single sampling
Unless otherwise agree in written, the sampling inspection shall be
applied to the incoming inspection of customer.
Sampling table: MIL-STD-105E
Lot size: Quantity of shipment lot per model.
Uniformity of Pixel
Major
Minor
AQL 0.65%
AQL 1.00%
AQL 2.5%
(2) Pixel shape ( with Projection)
(3) Pin hole
Total acceptable number : 1/pixel, 5/cell
Definition
It is a defect that is likely to result in failure or to reduce
materially the usability of the product for the intended
function.
It is a defect that is likely to assembly size and not result
in functioning problem.
It is a defect that will not result in functioning problem
with deviation classified.
(4) Deformation
Y
(Less than 0.1 mm is no counted)
0.152
X
Should not be connected to
next pixel
X ( X + Y ) / 2 ≤ 0.3mm
Y
( X + Y )/2 ≤ 0.02mm
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