isl84467 Intersil Corporation, isl84467 Datasheet - Page 7

• Manufacturer Part Number: isl84467
• Description: Ultra Low On-resistance, +1.65v To +4.5v, Single Supply, Quad Spdt Dual Dpdt Analog Switch
• Manufacturer: Intersil Corporation

Test Circuits and Waveforms
Detailed Description
The ISL84467 is a bidirectional, quad single pole/double
throw (SPDT) analog switch that offers precise switching
capability from a single 1.65V to 4.5V supply with low
ON-resistance (0.39Ω) and high speed operation (t
t
battery powered equipment due to its low operating supply
voltage (1.65V), low power consumption (6.3µW max), low
leakage currents (165nA max), and the tiny TQFN package.
The ultra low ON-resistance and
insertion loss and distortion to applications that require signal
reproduction.
External V+ Series Resistor
For improved ESD and latch-up immunity, Intersil
recommends adding a 100Ω resistor in series with the V+
power supply pin of the ISL84467 IC (see Figure 8).
During an overvoltage transient event, such as occurs during
system level IEC 61000 ESD testing, substrate currents can be
generated in the IC that can trigger parasitic SCR structures to
OFF
SIGNAL
GENERATOR
ANALYZER
SIGNAL
GENERATOR
ANALYZER
= 16ns). The device is especially well suited for portable
FIGURE 4. OFF ISOLATION TEST CIRCUIT
FIGURE 6. CROSSTALK TEST CIRCUIT
R
0V or V+
L
R
L
NO or NC
COM
IN
NO or NC
COM
1
7
r
ON
GND
GND
NC or NO
flatness provide very low
COM
V+
V+
(Continued)
IN
C
C
0V or V+
ON
50Ω
= 33ns,
NC
ISL84467
turn ON, creating a low impedance path from the V+ power
supply to ground. This will result in a significant amount of
current flow in the IC which can potentially create a latch-up
state or permanently damage the IC. The external V+
resistor limits the current during this over-stress situation
and has been found to prevent latch-up or destructive
damage for many overvoltage transient events.
Under normal operation, the sub-microamp IDD current of
the IC produces an insignificant voltage drop across the
100Ω series resistor resulting in no impact to switch
operation or performance.
IMPEDANCE
ANALYZER
V
NX
r
ON
100mA
FIGURE 7. CAPACITANCE TEST CIRCUIT
= V
1
/100mA
FIGURE 5. r
V
1
COM
NO or NC
ON
NO or NC
COM
TEST CIRCUIT
GND
GND
V+
IN
V+
IN
C
0V or V+
0V or V+
C
July 17, 2007
FN6521.0