SSTUB32865 NXP Semiconductors, SSTUB32865 Datasheet - Page 18

• Manufacturer Part Number: SSTUB32865
• Description: Sstub32865 1.8 V 28-bit 1 2 Registered Buffer With Parity For Ddr2-800 Rdimm Applications
• Manufacturer: NXP Semiconductors

NXP Semiconductors
11. Test information
SSTUB32865_3
Product data sheet
11.1 Test circuit
All input pulses are supplied by generators having the following characteristics:
Pulse Repetition Rate (PRR)
unless otherwise specified.
The outputs are measured one at a time with one transition per measurement.
Fig 8. Load circuit
Fig 9. Voltage and current waveforms; inputs active and inactive times
Fig 10. Voltage waveforms; pulse duration
(1) C
(1) I
CK inputs
V
V
V
DD
ID
IH
IL
L
includes probe and jig capacitance.
= V
tested with clock and data inputs held at V
= 600 mV.
= V
ref
ref
+ 250 mV (AC voltage levels) for differential inputs. V
R L = 100
test point
test point
250 mV (AC voltage levels) for differential inputs. V
RESET
input
LVCMOS
50
Rev. 03 — 27 March 2007
I
DD
(1)
10 MHz; Z
0.5V
t
INACT
DD
V
10 %
ICR
CK
CK
DUT
0
1.8 V DDR2-800 registered buffer with parity
= 50 ; input slew rate = 1 V/ns
OUT
t
W
DD
or GND, and I
delay = 350 ps
Z o = 50
0.5V
V
ICR
t
IL
IH
ACT
O
DD
= GND for LVCMOS inputs.
= 0 mA.
= V
C L = 30 pF (1)
SSTUB32865
002aaa373
V
0 V
DD
DD
V
002aaa372
ID
for LVCMOS inputs.
90 %
V
V
IH
IL
© NXP B.V. 2007. All rights reserved.
V
DD
R L = 1000
R L = 1000
002aaa371
20 %,
18 of 28