ds42585 Advanced Micro Devices, ds42585 Datasheet - Page 36

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ds42585

Manufacturer Part Number
ds42585
Description
Stacked Multi-chip Package Mcp Flash Memory And Sram
Manufacturer
Advanced Micro Devices
Datasheet
TEST CONDITIONS
Note: Diodes are IN3064 or equivalent
KEY TO SWITCHING WAVEFORMS
36
Device
Under
3.0 V
0.0 V
Test
WAVEFORM
Figure 11.
Input
C
L
Figure 12. Input Waveforms and Measurement Levels
Test Setup
Don’t Care, Any Change Permitted
1.5 V
6.2 k
Does Not Apply
3.3 V
INPUTS
P R E L I M I N A R Y
2.7 k
Measurement Level
DS42585
Output Load
Output Load Capacitance, C
(including jig capacitance)
Input Rise and Fall Times
Input Pulse Levels
Input timing measurement reference
levels
Output timing measurement
reference levels
Changing from H to L
Changing from L to H
Steady
Center Line is High Impedance State (High Z)
Test Condition
Table 14. Test Specifications
Changing, State Unknown
OUTPUTS
L
1.5 V
0.0–3.0
85 ns
1.5
1.5
30
1 TTL gate
5
Output
KS000010-PAL
Unit
pF
ns
V
V
V

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