scan921025h05 National Semiconductor Corporation, scan921025h05 Datasheet - Page 4

• Manufacturer Part Number: scan921025h05
• Description: High Temperature 20-80 Lvds Serdes With Ieee 1149.1 Jtag At-speed Bist
• Manufacturer: National Semiconductor Corporation

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Test Modes
system clocks (At a SCLK of 66Mhz and TCK of 1MHz this
allows for 66 TCK cycles). This is not a concern when both
devices are on the same scan chain or LSP, however, it can
be a problem with some multi-drop devices. This test mode
has been simulated and verified using National’s SCAN-
STA111.
DIN0 Held Low-DIN1 Held High Creates an RMT Pattern
DIN8 Held Low-DIN9 Held High Creates an RMT Pattern
(Continued)
FIGURE 1. RMT Patterns Seen on the Bus LVDS Serial Output
20120724
20120726
4
DIN4 Held Low-DIN5 Held High Creates an RMT Pattern
Ordering Information
NSID
SCAN921025HSM
SCAN921226HSM
Deserializer
Function
Serializer
20120725
Package
SLC49a
SLC49a