74hc3gu04 NXP Semiconductors, 74hc3gu04 Datasheet - Page 8

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74hc3gu04

Manufacturer Part Number
74hc3gu04
Description
Inverters Gates
Manufacturer
NXP Semiconductors
Datasheet

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
74hc3gu04DP
Manufacturer:
NXP/恩智浦
Quantity:
20 000
Philips Semiconductors
2003 Nov 26
handbook, full pagewidth
handbook, halfpage
Inverter
V
Fig.7
g
t
t
t
O
fs
PLH
PLZ
PHZ
is constant.
=
/t
/t
/t
TEST
-------- -
(f = 1 kHz)
PZL
PHL
PZH
I
V
O
V I
I
Test set-up for measuring forward
transconductance.
.
0.47 F
input
open
V
GND
CC
R bias = 560 k
S1
V CC
GENERATOR
output
PULSE
100 F
Definitions for test circuit:
R
C
R
MNA050
Fig.6 Load circuitry for switching times.
L
L
T
= load resistor.
= load capacitance including jig and probe capacitance.
= termination resistance should be equal to the output impedance Z
A
V I
I O
GND
R T
D.U.T.
V CC
8
V O
handbook, halfpage
T
Fig.8
(mA/V)
amb
g fs
30
20
10
= 25 C.
50 pF
C L =
0
0
Typical forward transconductance (g
function of the supply voltage (V
MNA742
R L =
1 k
S1
2
open
GND
V CC
4
o
of the pulse generator.
74HC3GU04
Product specification
6
V CC (V)
CC
MNB124
).
fs
8
) as a

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