tda8262hn-c1 NXP Semiconductors, tda8262hn-c1 Datasheet - Page 20

• Manufacturer Part Number: tda8262hn-c1
• Description: Tda8262hn Fully Integrated Satellite Tuner
• Manufacturer: NXP Semiconductors

Philips Semiconductors
13. Limiting values
14. Thermal characteristics
9397 750 13194
Product data sheet
Table 36:
Table 37:
In accordance with the Absolute Maximum Rating System (IEC 60134).
[1]
[2]
[3]
[4]
Table 38:
Symbol
PORT1
Symbol
V
V
T
T
T
t
V
Symbol
R
sc
amb
stg
j
CC
I
esd
th(j-a)
Maximum ratings cannot be exceeded, not even momentarily without causing irreversible damages to the
IC. Maximum ratings cannot be accumulated.
Each pin to V
Test in accordance with JEDEC specification EIA/JESD22-114B .
Test in accordance with JEDEC specification EIA/JESD22-A115-A .
Parameter
supply voltage
input voltage
ambient temperature
storage temperature
junction temperature
short circuit time
electrostatic discharge
voltage
Internal circuitry
Limiting values
Thermal characteristics
Parameter
thermal resistance
junction to ambient
CC
or GND; except RFIN pin which should never exceed V
Pin
32
Rev. 01 — 14 December 2004
…continued
Equivalent circuit
Conditions
JEDEC 4 layer test board with 9
thermal vias (exposed die pad
soldered on board)
Conditions
pins SDA, SCL,
PORT1 and PORT0
pin RFIN
all other pins
human body model
machine model
V
V
pin PORT0 (pin 8)
all other pins
CC
CC
GND(DIG)
< 3.3 V
PORT1
3.3 V
Fully integrated satellite tuner
[2]
[3]
[4]
© Koninklijke Philips Electronics N.V. 2004. All rights reserved.
500
Min
-
-
-
-
-
CC
0.5
0.3
0.3
0.3
0.3
20
40
TDA8262HN
[1]
0.3 V.
test
CMOS logic
Max
+3.6
+5.5
V
V
+3.6
+85
+125
125
10
1000
2000
200
CC
CC
Typ
43
001aaa996
+ 0.3
0.3
test
Unit
K/W
Unit
V
V
V
V
V
s
V
V
V
20 of 30
C
C
C