atf1504se ATMEL Corporation, atf1504se Datasheet - Page 12

• Manufacturer Part Number: atf1504se
• Description: Family Datasheet
• Manufacturer: ATMEL Corporation

JTAG
Boundary-scan
Cell (BSC)
Testing
Boundary-scan
Definition
Language
(BSDL) Models
12
ATF15xxSE Family
The ATF15xxSE Family has four dedicated input pins and a number of I/O pins depending on
the device type and package type selected. Each input pin and I/O pin has a boundary-scan
cell (BSC) which supports boundary-scan testing as described in detail by IEEE Standard
1149.1. A typical BSC consists of three capture registers or scan registers and up to two
update registers. There are two types of BSCs, one for input or I/O pin, and one for the macro-
cells. The BSCs in the device are chained together through the (BST) capture registers. Input
to the capture register chain is fed in from the TDI pin while the output is directed to the TDO
pin. Capture registers are used to capture active device data signals, to shift data in and out of
the device and to load data into the update registers. Control signals are generated internally
by the JTAG TAP controller.
Note:
These are now available in all package types via the Atmel web site. These models conform to
the IEEE 1149.1 standard and can be used for Boundary-scan Test Operation of the
ATF15xxSE Family.
The BSC configuration for the input and I/O pins and macrocells are shown on page 13.
Device
ATF1502SE
ATF1504SE
ATF1508SE
ATF1516SE
Shaded data is preliminary and subject to change without notice.
Register Length
Boundary-Scan
192
352
672
96
MSB
0000,0001,0101,0100,0010,0000,0011,1111
0000,0001,0101,0100,0100,0000,0011,1111
0000,0001,0101,0100,1000,0000,0011,1111
0000,0001,0101,0101,0000,0000,0011,1111
IDCODE
2401D–PLD–09/02
LSB