lm45cim3x-nipd National Semiconductor Corporation, lm45cim3x-nipd Datasheet - Page 3

• Manufacturer Part Number: lm45cim3x-nipd
• Description: Sot-23 Precision Centigrade Temperature Sensors
• Manufacturer: National Semiconductor Corporation

Accuracy
(Note 6)
Nonlinearity
(Note 7)
Sensor Gain
(Average Slope)
Load Regulation (Note 8)
Line Regulation
(Note 8)
Quiescent Current
(Note 9)
Change of Quiescent
Current (Note 9)
Temperature Coefficient
of Quiescent Current
Minimum Temperature
for Rated Accuracy
Long Term Stability (Note 10)
Absolute Maximum Ratings
Electrical Characteristics
Unless otherwise noted, these specifications apply for +V
fications also apply from +2.5˚C to T
to T
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. DC and AC electrical specifications do not apply when operating
the device beyond its rated operating conditions.
Note 2: Reflow temperature profiles are different for lead-free and non-lead-free packages.
Note 3: Human body model, 100 pF discharged through a 1.5 kΩ resistor. Machine model, 200 pF discharged directly into each pin.
Note 4: Thermal resistance of the SOT-23 package is 260˚C/W, junction to ambient when attached to a printed circuit board with 2 oz. foil as shown in Figure 3.
Note 5: Limits are guaranteed to National’s AOQL (Average Outgoing Quality Level).
Note 6: Accuracy is defined as the error between the output voltage and 10 mv/˚C times the device’s case temperature, at specified conditions of voltage, current,
and temperature (expressed in ˚C).
Note 7: Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the device’s rated temperature
range.
Note 8: Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating effects can be
computed by multiplying the internal dissipation by the thermal resistance.
Note 9: Quiescent current is measured using the circuit of Figure 1.
Note 10: For best long-term stability, any precision circuit will give best results if the unit is aged at a warm temperature, and/or temperature cycled for at least 46
hours before long-term life test begins. This is especially true when a small (Surface-Mount) part is wave-soldered; allow time for stress relaxation to occur.
Supply Voltage
Output Voltage
Output Current
Storage Temperature
ESD Susceptibility (Note 3):
Human Body Model
Machine Model
MAX
; all other limits T
Parameter
A
= T
J
= +25˚C, unless otherwise noted.
T
T
T
T
T
0≤I
+4.0V≤+V
+4.0V≤+V
+4.0V≤+V
4.0V≤+V
In circuit of
Figure 1, I
T
A
A
A
MIN
MIN
J
MAX
=T
=+25˚C
=T
=T
L
≤ +1 mA
≤T
≤T
MAX
MAX
MIN
in the circuit of Figure 1 for +V
−65˚C to +150˚C
A
A
Conditions
≤T
≤T
S
, for 1000 hours
+12V to −0.2V
+V
≤10V
L
S
S
S
=0
MAX
MAX
≤+10V
≤+10V, +25˚C
≤+10V
(Note 1)
S
+ 0.6V to
10 mA
2000V
−1.0V
250V
S
= +5Vdc and I
3
Typical
±
+2.0
Operating Ratings
Soldering process must comply with National Semiconduc-
tor’s Reflow Temperature Profile specifications. Refer to
www.national.com/packaging. (Note 2)
0.12
Specified Temperature Range
Operating Temperature Range
Supply Voltage Range (+V
(Note 4)
LM45B, LM45C
LM45B
S
LM45B, LM45C
LOAD
= +5Vdc. Boldface limits apply for T
(Note 5)
±
+10.3
Limit
±
±
±
±
±
+9.7
+2.5
= +50 µA, in the circuit of Figure 2. These speci-
±
120
160
2.0
0.80
2.0
3.0
3.0
0.8
1.2
35
Typical
±
+2.0
0.12
S
)
LM45C
(Note 1)
(Note 5)
+10.3
±
Limit
±
±
±
±
+9.7
±
+2.5
±
120
160
2.0
0.80
3.0
4.0
4.0
0.8
1.2
35
−20˚C to +100˚C
−40˚C to +125˚C
+4.0V to +10V
A
T
= T
MIN
mV/mA (max)
mV/˚C (max)
mV/˚C (min)
mV/V (max)
mV/V (max)
www.national.com
µA (max)
µA (max)
µA (max)
˚C (max)
˚C (max)
˚C (max)
˚C (max)
˚C (min)
(Limit)
to T
J
µA/˚C
Units
= T
˚C
MAX
MIN