mlx90313 ETC-unknow, mlx90313 Datasheet - Page 14

• Manufacturer Part Number: mlx90313
• Description: Programmable Ir Sensor Interface
• Manufacturer: ETC-unknow

Digital Section
The digital unit on board of MLX90313 realizes all functions for control, configuration, measurements and
linearisation. It contains several registers, ALU and control logic. All functions of the ASIC are hardware
fixed and controlled by different state machines, which execute in sequence all procedures necessary for
normal chip operation.
Internal registers overview
The table below contains all internal registers, their addresses for access via SPI serial interface and short
functional description. Depending on their function they can be divided in 3 groups:
Internal Register Table.
Register
IRGAIN1
IRGAIN2
TEMPGAIN
CONFREG1
CONFREG2
OSCILLATOR
BGCONTROL
LPF
ADCREG
IROUT
TOUT
IRDATA
TDATA
IROS
TOS
MAINSTM
TEST
REG TEMP
REG A
REG B
TESTCTRL 1
REG C
REG E
TESTCTRL 2
WP
MLX90313 Programmable IR sensor Interface
3901090313
Control registers: they keep the configuration of the chip including all gain settings of the amplifiers,
analog ground level, band-gap and oscillator trimming data, etc. All this data is stored in eeprom and
after POR the system loads it in the corresponding peripheral registers.
Data registers: they keep all data for offsets, results from measurements and linearisation of both
chains. This registers can be read vis spi in normal mode and are write accessible during test mode.
Computation registers. These registers support the computation unit and keep all temporary data
necessary for digital low pas filtering, linearisation and comparator functions. They are not accessible
via SPI in normal mode.
Function
IR-chain settings
IR-chain settings
Temp-chain settings
Configuration
Configuration
Oscillator
Bandgap control
Low Pass Filter
ADC output data
Tobject (lin)
Tambient (lin)
IR-chain output
Temp-chain output
IR-chain offset
Temp-chain offset
Main state machine
Test mode control
Temporary register for test
Accumulator A
Accumulator B
Test control
Accumulator C
Accumulator E
ADC test control
Eeprom write protect
Address
Dec
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
20
23
24-
31
Page 14
Hex
00h
01h
02h
03h
04h
05h
06h
07h
08h
09h
0Ah
0Bh
0Ch
0Dh
0Eh
0Fh
10h
14h
17h
18h-
1Fh
Programmable IR Sensor Interface
Access via spi
Write
Test mode
Test mode
Test mode
Test mode
Test mode
Test mode
Test mode
Test mode
Test mode
Test mode
Test mode
Test mode
Test mode
Test mode
Test mode
Test mode
Always
Test mode
Test mode
Test mode
Test mode
Test mode
Testmode
Test mode
Always
MLX90313
Read
No
No
No
Always
Always
No
No
No
Always
Always
Always
Always
Always
Always
Always
No
No
No
No
No
No
No
No
No
No
Rev 1.0 21-July-2001