lm9073 National Semiconductor Corporation, lm9073 Datasheet - Page 15

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lm9073

Manufacturer Part Number
lm9073
Description
Dual High Current Low-dropout System Regulator
Manufacturer
National Semiconductor Corporation
Datasheet
Application Information
ELECTRO-MAGNETIC COMPATIBILTIY (EMC)
Systems utilizing the LM9073 will not experience loss of
supply or false reset signals from the regulator when sub-
jected to high frequency interference from a standard Bulk
Current Injection test (ISO11452 Part 4 test method). The
following test conditions and configuration (Figure 8) can be
used to verify this performance:
• Frequency Range
• Modulation 1
• Modulation 2
• Dwell Time
• Frequency Steps
2MHz (from 10MHz to 200MHz)
1MHz (from 1MHz to 10MHz)
1kHz sine wave, 80% AM
1MHz to 400MHz
(Continued)
BCI Susceptibility, Modulation 1 (CW)
BCI Susceptibility, Modulation 2 (CW)
(no modulation)
FIGURE 9. Examples of BCI Test
(1kHz, 80% AM Modulation)
1 second
15
In this test configuration the current injected in to either the
input pin or the tracking output pin is increased until a reset
output is generated. These two pins are the most critical as
they typically will connect to a module through long lengths
of wire most likely to pick up high frequency energy. Figure 9
illustrates examples of test results on the LM9073 with both
types of modulation.
These results are just examples as actual results in any
given application will depend on numerous external factors
such as component selection, pc board layout, etc. The
current power of the injected signal is expressed indB rela-
tive to 1mA (i.e. 40dBmA = 100mA)
• Test Method
10129625
10129626
20MHz (from 200MHz to 400MHz)
Closed loop current probe
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