74aup1t57gf NXP Semiconductors, 74aup1t57gf Datasheet - Page 11

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74aup1t57gf

Manufacturer Part Number
74aup1t57gf
Description
74aup1t57 Low-power Configurable Gate With Voltage-level Translator
Manufacturer
NXP Semiconductors
Datasheet
NXP Semiconductors
Table 11.
[1]
74AUP1T57_1
Product data sheet
Supply voltage
V
2.3 V to 3.6 V
Fig 13. Load circuitry for switching times
CC
For measuring enable and disable times R
Test data is given in
Definitions for test circuit:
R
C
R
V
EXT
L
L
T
Test data
= Load resistance.
= Load capacitance including jig and probe capacitance.
= Termination resistance should be equal to the output impedance Z
= External voltage for measuring switching times.
Load
C
5 pF, 10 pF, 15 pF and 30 pF
L
Table
11.
L
G
= 5 k , for measuring propagation delays, setup and hold times and pulse width R
V I
Rev. 01 — 3 January 2008
R
5 k or 1 M
R T
Low-power configurable gate with voltage-level translator
L
[1]
DUT
V
CC
V O
o
V
t
open
C L
PLH
of the pulse generator.
001aac521
EXT
V
EXT
, t
5 k
R L
PHL
t
GND
PZH
, t
74AUP1T57
PHZ
© NXP B.V. 2008. All rights reserved.
t
2
PZL
V
, t
CC
PLZ
L
11 of 17
= 1 M .

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