lh28f016sc-l Sharp Microelectronics of the Americas, lh28f016sc-l Datasheet - Page 26

• Manufacturer Part Number: lh28f016sc-l
• Description: M-bit Smartvoltage Flash Memories
• Manufacturer: Sharp Microelectronics of the Americas

6.2.1 CAPACITANCE
NOTE :
1. Sampled, not 100% tested.
6.2.2 AC INPUT/OUTPUT TEST CONDITIONS
C
C
SYMBOL
IN
OUT
AC test inputs are driven at 2.7 V for a Logic "1" and 0.0 V for a Logic "0". Input timing begins, and output
timing ends, at 1.35 V. Input rise and fall times (10% to 90%) < 10 ns.
AC test inputs are driven at 3.0 V for a Logic "1" and 0.0 V for a Logic "0". Input timing begins, and output
timing ends, at 1.5 V. Input rise and fall times (10% to 90%) < 10 ns.
AC test inputs are driven at V
begins at V
90%) < 10 ns.
Input Capacitance
Output Capacitance
0.45
2.7
0.0
3.0
0.0
2.4
Fig. 10 Transient Input/Output Reference Waveform for V
IH
Fig. 9 Transient Input/Output Reference Waveform for V
(2.0 V
PARAMETER
INPUT
INPUT
TTL
INPUT
(NOTE 1)
Fig. 11 Transient Input/Output Reference Waveform for
) and V
V
IL
OH
CC
V
(0.8 V
CC
(2.4 V
= 5.0±0.25 V (High Speed Testing Configuration)
= 5.0±0.5 V (Standard Testing Configuration)
1.35
1.5
TTL
2.0
0.8
TTL
). Output timing ends at V
T
) for a Logic "1" and V
A
= +25
TYP.
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6
8
TEST POINTS
TEST POINTS
˚
TEST POINTS
C, f = 1 MHz
MAX.
12
8
OL
IH
and V
(0.45 V
IL
. Input rise and fall times (10% to
TTL
CC
CC
UNIT
pF
pF
) for a Logic "0". Input timing
1.35
1.5
= 3.3±0.3 V and
= 2.7 to 3.6 V
2.0
0.8
OUTPUT
OUTPUT
OUTPUT
LH28F016SC-L/SCH-L
V
V
IN
OUT
= 0.0 V
= 0.0 V
CONDITION