lp5527tlx National Semiconductor Corporation, lp5527tlx Datasheet - Page 17

• Manufacturer Part Number: lp5527tlx
• Description: Tiny Led Driver For Camera Flash And 4 Leds With I2c Programmability, Connectivity Test And Audio Synchronization
• Manufacturer: National Semiconductor Corporation

I
NOTE: Data guaranteed by design
Test Interface
The test bus can be controlled externally or internally. For
the external control, the LP5527 pins V
powered. External control is independent on status of NRST
and V
The device is capable of detecting a defective unit in three
cases:
• Production test 1: The LP5527 is assembled on a
• Production test 2: The LP5527 is assembled on a PWB
2
C Compatible Interface
printed wiring board (PWB), but there is no LEDs con-
nected on current sink outputs. An external 4.2V test
voltage is supplied on the V
which follows that the reset operating mode is entered
with POR. Test pin T1 is pulled high. The chip will send an
acknowledge “1” onto the T2 pin if the chip is in working
order; otherwise T2 stays low (0). Refer to Test Interface
Timing Diagram.
with the external components shown in LP5527 Block
Diagram. 4.2V voltage is connected to V
FB pins (see the figure above), from which follows that
the reset operating mode is entered with POR. Test pin
T1 is pulled high. The chip will send an acknowledge “1”
DDIO
C
10
b
pins. T1 is an input and it has an internal 6 kΩ
Bus Free Time between a STOP and a START Condition
Capacitive Load for Each Bus Line
High Level Schematic Representation of the Test Interface
DD1
and V
DD1,2
(Continued)
only need to be
DD2
DD1
, V
pins, from
DD2
and
17
pull-down resistor. T2 is an output line for the test result with
an internal 200 kΩ pull-down resistor. When T1 is low, T2 is
always pulled down; when T1 is high, T2 is indicating the
result of the test.
• Field test: Build-in self-test through the I
onto the T2 pin if the chip is in working order; otherwise
T2 stays low (0). If the ACK is “1”, a repetitive test pattern
“0-1-0-1-0-1-0-1-0-1-0-1” is applied to T1 pin and if the
LED corresponding the pattern (see Test Interface Timing
Diagram) is connected properly T2 gives “1”, otherwise
T2 stays low. The last “1” disengages the test.
control interface. The LP5527 is enabled (NSTBY(bit) =
1, EN_BOOST(bit) = 1) and external test pins T1 and T2
are disconnected. The result can be read through the I
compatible control interface. LED test is enabled by writ-
ing to address 0Ch hex data 01h. Result can be read
from the same address during the next I
I
of the test procedure. For that reason the clock signal
frequency should be 50 kHz or less during the build-in
self-test.
2
C compatible interface clock signal controls the timing
20184019
1.3
10
200
2
2
C cycle. Note:
C compatible
www.national.com
µs
pF
2
C