saa5261 NXP Semiconductors, saa5261 Datasheet - Page 16

• Manufacturer Part Number: saa5261
• Description: Saa5261; Saa5262; Saa5263 10-page Intelligent Teletext Decoders
• Manufacturer: NXP Semiconductors

Philips Semiconductors
Group C
Table 8 Reliability tests (by package family); note 1
Note
1. FPM = fraction of devices failing at test conditions, in Failures Per Million.
Table 9 Reliability tests (by device type)
CHARACTERISTICS
V
1998 Apr 22
Operational life
Humidity life
Temperature cycling
performance
ESD and latch-up
Supplies
V
V
V
I
I
I
Digital inputs
P
V
V
I
C
SYMBOL
DDD(M)
DDA
DDD(T)
LI
DDD(M)
DDD(M)
DDA
DDD(T)
IN
IL
IH
i
10-page intelligent teletext decoders
RESET
= 5 V 10%; V
microcontroller supply
voltage
analog supply voltage referenced to V
teletext supply
voltage
microcontroller supply
current
analog supply current
teletext supply
current
LOW-level input
voltage
HIGH-level input
voltage
input leakage current
input capacitance
TEST
TEST
PARAMETER
SS
= 0 V; T
amb
168 hours at T
temperature, humidity, bias 1000 hours,
T
test)
T
ESD human body model 100 pF, 1.5 k
ESD machine model 200 pF, 0
latch-up
referenced to V
referenced to V
V
amb
stg(min)
= 20 to +70 C; unless otherwise specified.
i
= 0 to V
CONDITIONS
= 85 C, 85% RH (or equivalent
to T
DDD(M)
stg(max)
CONDITIONS
CONDITIONS
j
= 150 C
SSD
SSD
SSD
16
4.5
4.5
4.5
0.7V
0.3
10
DDD(M)
MIN.
SAA5261; SAA5262; SAA5263
5.0
5.0
5.0
20
35
50
<1000 FPM at T
<2000 FPM
<2000 FPM
<2000 V
<200 V
100 mA, 1.5V
TYP.
REQUIREMENTS
REQUIREMENTS
DDD
5.5
5.5
5.5
35
50
80
0.2V
V
+10
4
DDD(M)
j
= 70 C
(absolute maximum)
DDD(M)
Product specification
MAX.
+ 0.3
0.1 V
V
V
V
mA
mA
mA
V
pF
UNIT
A