hcts164ms Intersil Corporation, hcts164ms Datasheet - Page 5
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hcts164ms
Manufacturer Part Number
hcts164ms
Description
Rad-hard 8-bit Serial-in/parallel-out Shift Register
Manufacturer
Intersil Corporation
Datasheet
1.HCTS164MS.pdf
(8 pages)
NOTES:
NOTE:
NOTE:
CP to Qn
CP to Qn
MR to Qn
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500Ω, CL = 50pF, Input TR = TF = 3ns, VIL = GND, VIH = VCC.
3. For functional tests VO ≥4.0V is recognized as a logic “1”, and VO ≤0.5V is recognized as a logic “0”.
1. Alternate Group A Testing in accordance with Method 5005 of MIL-STD-883 may be exercised.
1. Except FN Test which will be performed 100% Go/No-Go.
Initial Test (Preburn-In)
Interim Test 1 (Postburn-In)
Interim Test 2 (Postburn-In)
PDA
Interim Test 3 (Postburn-In)
PDA
Final Test
Group A (Note 1)
Group B
Group D
Group E Subgroup 2
CONFORMANCE
CONFORMANCE GROUPS
PARAMETERS
GROUPS
TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25
ICC
IOL/IOH
Subgroup B-5
Subgroup B-6
METHOD
PARAMETER
5005
SYMBOL
TPLH
TPHL
TPHL
Specifications HCTS164MS
TABLE 7. TOTAL DOSE IRRADIATION
TABLE 6. APPLICABLE SUBGROUPS
VCC = 4.5V
VCC = 4.5V
VCC = 4.5V
Sample/5005
Sample/5005
Sample/5005
Sample/5005
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
METHOD
PRE RAD
1, 7, 9
SUBGROUP
GROUP B
CONDITIONS
(NOTES 1, 2)
5
5
TEST
5
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
1, 2, 3, 7, 8A, 8B, 9, 10, 11
GROUP A SUBGROUPS
POST RAD
2, 3, 8A, 8B, 10, 11
Table 4
1, 7, 9, Deltas
1, 7, 9, Deltas
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
-15% of 0 Hour
DELTA LIMIT
12µA
+25
+25
+25
TEMP
PRE RAD
o
o
o
1, 9
C
C
C
READ AND RECORD
ICC, IOL/H
ICC, IOL/H
ICC, IOL/H
ICC, IOL/H
Subgroups 1, 2, 3, 9, 10, 11
o
C)
READ AND RECORD
MIN
2
2
2
200K RAD
Spec Number
LIMITS
Table 4 (Note 1)
MAX
POST RAD
33
40
42
UNITS
518613
ns
ns
ns