hcts08ms Intersil Corporation, hcts08ms Datasheet - Page 4

• Manufacturer Part Number: hcts08ms
• Description: Radiation Hardened Quad 2-input And Gate
• Manufacturer: Intersil Corporation

NOTES:
NOTES:
NOTE:
Noise Immunity
Functional Test
Input to Output
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500 , CL = 50pF, Input TR = TF = 3ns, VIL = GND, VIH = 3V.
3. For functional tests, VO
1. Alternate Group A testing in accordance with MIL-STD-883 Method 5005 may be exercised.
2. Table 5 parameters only.
1. Except FN test which will be performed 100% Go/No-Go.
Initial Test
Interim Test
PDA
Final Test
Group A (Note 1)
Subgroup B5
Subgroup B6
Group D
Group E Subgroup 2
PARAMETERS
CONFORMANCE
COMFORMANCE GROUP
GROUPS
TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25
ICC
IOL/IOH
SYMBOL
4.0V is recognized as a logic “1”, and VO
TPHL
TPLH
FN
METHOD
PARAMETER
5005
VCC = 4.5V, VIH = 2.25V,
VIL = 0.8V at 200K RAD, (Note 3)
VCC = 4.5V
VCC = 4.5V
MIL-STD-883 METHOD
Specifications HCTS08MS
TABLE 7. TOTAL DOSE IRRADIATION
TABLE 6. APPLICABLE SUBGROUPS
Sample 5005
Sample 5005
Sample 5005
Sample 5005
100% 5004
100% 5004
100% 5004
100% 5004
PRE RAD
CONDITIONS
1, 7, 9
(NOTES 1, 2)
SUBGROUP
GROUP B
5
5
TEST
4
0.5V is recognized as a logic “0”.
POST RAD
Table 4
1, 2, 3, 7, 8A, 8B, 9, 10, 11,
1, 2, 3, 7, 8A, 8B, 9, 10, 11
2, 3, 8A, 8B, 10, 11
-15% of 0 Hour
DELTA LIMIT
TEMPERATURE
TESTED
1, 7, 9,
1, 7,
1, 7, 9
1, 7, 9
1, 7, 9
3 A
+25
+25
+25
GROUP A SUBGROUPS
o
o
o
C
C
C
PRE RAD
1, 9
READ AND RECORD
o
200K RAD LIMITS
C)
MIN
2
2
Spec Number
-
1, 2, 3,
RECORDED
1,
Table 4 (Note 1)
1 (Note 2)
MAX
POST RAD
20
22
-
(Note 2)
(Note 2)
UNITS
518842
ns
ns
-