hcts85ms Intersil Corporation, hcts85ms Datasheet - Page 6

• Manufacturer Part Number: hcts85ms
• Description: Rad-hard 4-bit Magnitude Comparator
• Manufacturer: Intersil Corporation

NOTES:
NOTE:
NOTES:
1. Alternate Group A testing in accordance with Method 5005 of MIL-STD-883 may be exercised.
2. Table 5 parameters only.
1. Except FN test which will be performed 100% Go/No-Go.
1. Each pin except VCC and GND will have a resistor of 10KΩ ± 5% for static burn-in.
2. Each pin except VCC and GND will have a resistor of 1KΩ ± 5% for dynamic burn-in.
Initial Test (Preburn-In)
Interim Test I (Postburn-In)
Interim Test II (Postburn-In)
PDA
Interim Test III (Postburn-In)
PDA
Final Test
Group A (Note 1)
Group B
Group D
Group E Subgroup 2
STATIC BURN-IN I TEST CONNECTIONS (Note 1)
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
DYNAMIC BURN-IN TEST CONDITIONS (Note 2)
OPEN
5, 6, 7
5, 6, 7
CONFORMANCE
-
CONFORMANCE GROUPS
GROUPS
NOTE: Each pin except VCC and GND will have a resistor of 47KΩ ± 5% for irradiation testing.
1, 8, 10, 11, 13
1 - 4, 8 - 15
GROUND
Subgroup B-5
Subgroup B-6
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
8
5, 6, 7,
OPEN
METHOD
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
5005
TABLE 9. IRRADIATION TEST CONNECTIONS
1/2 VCC = 3V ± 0.5V
Specifications HCTS85MS
TABLE 7. TOTAL DOSE IRRADIATION
TABLE 6. APPLICABLE SUBGROUPS
PRE RAD
Sample/5005
Sample/5005
Sample/5005
Sample/5005
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
METHOD
1, 7, 9
5, 6, 7
GROUND
-
-
8
TEST
POST RAD
6
Table 4
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
1, 2, 3, 7, 8A, 8B, 9, 10, 11
GROUP A SUBGROUPS
VCC = 6V ± 0.5V
2, 3, 8A, 8B, 10, 11
1 - 4, 9 - 16
1, 7, 9, Deltas
1, 7, 9, Deltas
2, 3, 4, 16
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
16
VCC = 5V ± 0.5V
PRE RAD
1 - 4, 9 - 16
1, 9
READ AND RECORD
50kHz
12, 15
ICC, IOL/H
ICC, IOL/H
ICC, IOL/H
Subgroups 1, 2, 3, 9, 10, 11,
(Note 2)
-
-
READ AND RECORD
OSCILLATOR
Spec Number
Table 4 (Note 1)
POST RAD
25kHz
9, 14
-
-
518624