hcts646ms Intersil Corporation, hcts646ms Datasheet - Page 6

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hcts646ms

Manufacturer Part Number
hcts646ms
Description
Radiation Hardened Octal Bus Transceiver/register, Three-state
Manufacturer
Intersil Corporation
Datasheet
NOTE: 1. Alternate Group A inspection in accordance with Method 5005 of Mil-Std-883 may be exercised.
NOTE: Except FN test which will be performed 100% Go/No-Go.
NOTES:
1. Each pin except VCC and GND will have a resistor of 10k
2. Each pin except VCC and GND will have a resistor of 680
Initial Test (Preburn-In)
Interim Test I (Postburn-In)
Interim Test II (Postburn-In)
PDA
Interim Test III (Postburn-In)
PDA
Final Test
Group A (Note 1)
Group B
Group D
Group E Subgroup 2
STATIC I BURN-IN (Note 1)
STATIC II BURN-IN (Note 1)
DYNAMIC BURN-IN (Note 2)
CONFORMANCE
CONFORMANCE GROUPS
GROUPS
OPEN
4 - 11
-
-
NOTE: Each pin except VCC and GND will have a resistor of 47K
Subgroup B-5
Subgroup B-6
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
OPEN
-
METHOD
1 - 3, 12, 21, 22
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
1 - 3, 12 - 23
5005
GROUND
12
TABLE 9. IRRADIATION TEST CONNECTIONS
Specifications HCTS646MS
TABLE 7. TOTAL DOSE IRRADIATION
TABLE 6. APPLICABLE SUBGROUPS
Sample/5005
Sample/5005
Sample/5005
Sample/5005
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
METHOD
PRE RAD
1, 7, 9
GROUND
1/2 VCC = 3V
12
4 - 11
5% for static burn-in
5% for dynamic burn-in
-
-
TEST
711
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
1, 2, 3, 7, 8A, 8B, 9, 10, 11
GROUP A SUBGROUPS
0.5V
POST RAD
2, 3, 8A, 8B, 10, 11
Table 4
1, 7, 9, Deltas
1, 7, 9, Deltas
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
VCC = 6V
1 - 11, 13 - 24
VCC = 5V
1 - 11, 13 - 24
5% for irradiation testing.
24
24
0.5V
PRE RAD
0.5V
1, 9
READ AND RECORD
ICC, IOL/H, IOZL/H
ICC, IOL/H, IOZL/H
ICC, IOL/H, IOZL/H
Subgroups 1, 2, 3, 9, 10, 11
50kHz
READ AND RECORD
23
Spec Number
-
-
OSCILLATOR
Table 4 (Note 1)
POST RAD
13 - 20
25kHz
-
-
518628

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