upa2352 Renesas Electronics Corporation., upa2352 Datasheet - Page 2

• Manufacturer Part Number: upa2352
• Description: Dual N-channel Mosfet
• Manufacturer: Renesas Electronics Corporation.

ELECTRICAL CHARACTERISTICS (T
Note Pulsed
Both the FET1 and the FET2 are measured. Test circuits are example of measuring the FET1 side.
TEST CIRCUIT 1 I
TEST CIRCUIT 3 V
When FET1 is
measured, between
GATE and SOURCE
of FET2 are shorted.
2
Zero Gate Voltage Source Current
Gate Leakage Current
Gate Cut-off Voltage
Forward Transfer Admittance
Source to Source On-state
Resistance
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Turn-on Delay Time
Rise Time
Turn-off Delay Time
Fall Time
Gate to Source Charge
Body Diode Forward Voltage
CHARACTERISTICS
Note
SSS
GS(off)
V
GS
G1
G2
Note
Note
G1
G1
G2
G2
S2
SYMBOL
S2
S2
S1
R
R
R
R
V
V
| y
C
t
t
I
I
SS(on)1
SS(on)2
SS(on)3
SS(on)4
C
C
GS(off)
d(on)
d(off)
Q
F(S-S)
SSS
GSS
t
t
oss
fs
iss
rss
r
f
S1
S1
G
A
|
= 25°C)
A
A
A
V
V
V
V
V
V
V
V
V
V
TEST CIRCUIT 7
I
R
V
TEST CIRCUIT 9
I
Data Sheet G17881EJ2V0DS
S
F
SS
V
SS
GS
SS
SS
GS
GS
GS
GS
SS
G1S1
G
= 4.0 A, V
= 4.0 A, V
SS
= 6.0 Ω, TEST CIRCUIT 8
= 24.0 V, V
= 10.0 V, I
= 10.0 V, I
= 10.0 V, V
= ±12.0 V, V
= 4.5 V, I
= 4.0 V, I
= 3.1 V, I
= 2.5 V, I
= 4.0 V, I
TEST CIRCUIT 2 I
When FET1 is
measured, between
GATE and SOURCE
of FET2 are shorted.
TEST CIRCUIT 4 | y
ΔI
S
TEST CONDITIONS
GS
GS
/ΔV
S
S
S
S
S
S
= 0 V, TEST CIRCUIT 6
= 2.0 A, TEST CIRCUIT 5
= 2.0 A, TEST CIRCUIT 5
= 2.0 A, TEST CIRCUIT 5
= 2.0 A, TEST CIRCUIT 5
= 4.0 V, V
S
GS
GS
= 1.0 mA, TEST CIRCUIT 3
= 2.0 A, TEST CIRCUIT 4
= 4.0 A, V
GS
SS
= 0 V, TEST CIRCUIT 1
= 0 V, f = 1.0 MHz
= 0 V, TEST CIRCUIT 2
DD
DD
= 20.0 V,
= 20.0 V,
GSS
fs
|
V
V
GS
GS
G1
G1
G2
G2
A
A
MIN.
24.0
25.0
31.5
33.5
0.5
2.5
G2
G2
G1
G1
S2
S2
TYP.
35.0
37.0
42.0
50.0
330
132
183
216
S1
S1
1.0
5.7
1.0
80
55
22
S2
A
S1
S1
A
MAX.
43.0
45.0
55.0
67.0
μ
V
±10
1.5
10
SS
PA2352
UNIT
mΩ
mΩ
mΩ
mΩ
μ
μ
pF
pF
pF
nC
ns
ns
ns
ns
V
S
V
A
A